Inventor · disambiguated record
Tadashi Chiba
Also filed as: CHIBA TADASHI
21 granted patents·4 pending applications·336 citations·filing 1990–2010
95Inventor score
Files withOKI ELECTRIC IND CO LTD7CHIBA TADASHI4OKI SEMICONDUCTOR CO LTD4UEMURA KOGYO KK3DAIDO METAL CO1
Top patents by PatentIndex Score
25 records- 0191US6677803B1Semiconductor integrated circuit deviceOKI ELECTRIC IND CO LTD·Filed 2002·Granted Jan 13, 2004·46 cites·5 claims
- 0288US7391269B2Amplifying circuitOKI ELECTRIC IND CO LTD·Filed 2005·Granted Jun 24, 2008·19 cites·8 claims
- 0386US7248480B2Semiconductor element, manufacturing method thereof, and high frequency integrated circuit using the semiconductor elementOKI ELECTRIC IND CO LTD·Filed 2005·Granted Jul 24, 2007·15 cites·14 claims
- 0485US5266181AControlled composite deposition methodUEMURA KOGYO KK·Filed 1992·Granted Nov 30, 1993·45 cites·18 claims
- 0582US6273943B1Electroless composite Plating Solution and Electroless composite plating methodUYEMURA C & CO LTD·Filed 2000·Granted Aug 14, 2001·28 cites·8 claims
- 0678US5232744AElectroless composite plating bath and methodUEMURA KOGYO KK·Filed 1991·Granted Aug 3, 1993·39 cites·9 claims
- 0773US7843031B2Ultraviolet detecting device and manufacturing method thereof, and ultraviolet quantity measuring apparatusOKI SEMICONDUCTOR CO LTD·Filed 2008·Granted Nov 30, 2010·2 cites·4 claims
- 0871US5199553ASliding contactor for electric equipmentFUJI ELECTRIC CO LTD·Filed 1991·Granted Apr 6, 1993·27 cites·2 claims
- 0971US5185216AComposite plating film for sliding memberDAIDO METAL CO·Filed 1990·Granted Feb 9, 1993·37 cites·6 claims
- 1069US6366141B1Semiconductor driver circuit utilizing substrate voltage controlOKI ELECTRIC IND CO LTD·Filed 2000·Granted Apr 2, 2002·14 cites·10 claims
- 1167US8395121B2Visible-region light measuring instrument and visible-region light measuring instrument manufacturing methodCHIBA TADASHI·Filed 2009·Granted Mar 12, 2013·1 cites·15 claims
- 1266US7791156B2Semiconductor device, optical measuring and detecting device, and method of manufacturing the sameOKI SEMICONDUCTOR CO LTD·Filed 2008·Granted Sep 7, 2010·3 cites·20 claims
- 1365US8077304B2Light amount measuring apparatusCHIBA TADASHI·Filed 2009·Granted Dec 13, 2011·4 cites·7 claims
- 1461US8044484B2Ultraviolet detecting device and manufacturing method thereof, and ultraviolet quantity measuring apparatusOKI SEMICONDUCTOR CO LTD·Filed 2010·Granted Oct 25, 2011·0 cites·2 claims
- 1561US7507587B2Automatic analysis and control system for electroless composite plating solutionUYEMURA CO LTD C·Filed 2005·Granted Mar 24, 2009·2 cites·7 claims
- 1660US5217536AComposite plating apparatusUEMURA KOGYO KK·Filed 1991·Granted Jun 8, 1993·21 cites·4 claims
- 1757US7781836B2SOI semiconductor device and method of manufacturing thereofOKI SEMICONDUCTOR CO LTD·Filed 2005·Granted Aug 24, 2010·1 cites·19 claims
- 1857US5938299ABraking force distribution controlling apparatusTOYOTA MOTOR CO LTD·Filed 1997·Granted Aug 17, 1999·13 cites·4 claims
- 1956US8134105B2Light quantity measuring device and method for measuring light quantity that selectively connects light reception elements based on incident light angleCHIBA TADASHI·Filed 2009·Granted Mar 13, 2012·2 cites·1 claims
- 2052US2009146048A1Photo detecting apparatusOKI ELECTRIC IND CO LTD·Filed 2008·Application pending·0 cites
- 2145US5103637ARocket engine combustion chamberMITSUBISHI HEAVY IND LTD·Filed 1990·Granted Apr 14, 1992·15 cites·7 claims
- 2244US6861849B2Capacity measuring device and capacity measuring methodOKI ELECTRIC IND CO LTD·Filed 2003·Granted Mar 1, 2005·2 cites·6 claims
- 2342US2008007364A1Voltage controlled oscillatorOKI ELECTRIC IND CO LTD·Filed 2007·Application pending·0 cites
- 2441US2003049169A1Automatic analyzing/controlling device for electroless composite plating solutionFiled 2001·Application pending·0 cites
- 2533US2006012009A1Semiconductor deviceCHIBA TADASHI·Filed 2005·Application pending·0 cites
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