Inventor · disambiguated record
Tsuyoshi Ataka
Also filed as: ATAKA TSUYOSHI
4 granted patents·1 pending application·2 citations·filing 2011–2016
57Inventor score
Top patents by PatentIndex Score
5 records- 0176US10088415B2Measuring probe using terahertz waveADVANTEST CORP·Filed 2016·Granted Oct 2, 2018·2 cites·3 claims
- 0235US8729918B2Test apparatus, circuit module and manufacturing methodATAKA TSUYOSHI·Filed 2011·Granted May 20, 2014·0 cites·8 claims
- 0334US9791512B2Test apparatus, test method, calibration device, and calibration methodADVANTEST CORP·Filed 2015·Granted Oct 17, 2017·0 cites·16 claims
- 0433US8773141B2Test apparatus and circuit moduleATAKA TSUYOSHI·Filed 2011·Granted Jul 8, 2014·0 cites·12 claims
- 0529US2017082668A1Measuring apparatus, measuring method, and recording mediumADVANTEST CORP·Filed 2016·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →