Inventor · disambiguated record
Keizo Yamada
Also filed as: YAMADA KEIZO
54 granted patents·12 pending applications·1,426 citations·filing 1984–2024
99Inventor score
Files withFAB SOLUTIONS INC24NEC CORP19FURUKAWA ELECTRIC CO LTD8TOPCON CORP5FURUKAWA BATTERY CO LTD4
Top patents by PatentIndex Score
66 records- 0197US6768324B1Semiconductor device tester which measures information related to a structure of a sample in a depth directionFAB SOLUTIONS INC·Filed 2000·Granted Jul 27, 2004·141 cites·35 claims
- 0296US5959760ALight beam scanner using large electrostatic forceNEC CORP·Filed 1998·Granted Sep 28, 1999·188 cites·16 claims
- 0395US10461545B2Battery systemHITACHI CHEMICAL CO LTD·Filed 2015·Granted Oct 29, 2019·17 cites·8 claims
- 0495US7385195B2Semiconductor device testerTOPCON CORP·Filed 2005·Granted Jun 10, 2008·25 cites·13 claims
- 0594US8036839B2Battery state determining apparatusSHIN KOBE ELECTRIC MACHINERY·Filed 2007·Granted Oct 11, 2011·32 cites·21 claims
- 0694US5874941APresentation supporting deviceNEC CORP·Filed 1995·Granted Feb 23, 1999·231 cites·15 claims
- 0791US6559662B1Semiconductor device tester and semiconductor device test methodFAB SOLUTIONS INC·Filed 2000·Granted May 6, 2003·59 cites·31 claims
- 0889US5081867ASemiconductor sensorNEC CORP·Filed 1989·Granted Jan 21, 1992·55 cites·7 claims
- 0988US6545650B1Apparatus for three-dimensionally displaying object and method of doing the sameNEC CORP·Filed 1999·Granted Apr 8, 2003·109 cites·17 claims
- 1087US6683308B2Method and apparatus for measuring thickness of thin filmFAB SOLUTIONS INC·Filed 2003·Granted Jan 27, 2004·51 cites·18 claims
- 1187US5514847AElectron beam radiator with cold cathode integral with focusing grid member and process of fabrication thereofNEC CORP·Filed 1994·Granted May 7, 1996·46 cites·2 claims
- 1286US6946857B2Semiconductor device testerFAB SOLUTIONS INC·Filed 2004·Granted Sep 20, 2005·25 cites·25 claims
- 1386US6614244B2Semiconductor device inspecting apparatusFAB SOLUTIONS INC·Filed 2001·Granted Sep 2, 2003·35 cites·13 claims
- 1484US6809534B2Semiconductor device test method and semiconductor device testerFAB SOLUTIONS INC·Filed 2001·Granted Oct 26, 2004·19 cites·37 claims
- 1583US6850079B2Film thickness measuring apparatus and a method for measuring a thickness of a filmFAB SOLUTIONS INC·Filed 2003·Granted Feb 1, 2005·16 cites·32 claims
- 1682US6975125B2Semiconductor device testerFAB SOLUTIONS INC·Filed 2004·Granted Dec 13, 2005·19 cites·42 claims
- 1780US8581557B2Direct-current power source apparatusKANOH MITSUYOSHI·Filed 2011·Granted Nov 12, 2013·12 cites·20 claims
- 1879US7232994B2Contact hole standard test device, method of forming the same, method of testing contact hole, method and apparatus for measuring a thickness of a film, and method of testing a waferFAB SOLUTIONS INC·Filed 2005·Granted Jun 19, 2007·3 cites·20 claims
- 1978US5396439AAcceleration sensing device having negative feedback loopNEC CORP·Filed 1992·Granted Mar 7, 1995·36 cites·29 claims
- 2076US7321805B2Production managing system of semiconductor deviceFAB SOLUTIONS INC·Filed 2004·Granted Jan 22, 2008·14 cites·38 claims
- 2176US6614050B1Semiconductor manufacturing apparatusFAB SOLUTIONS INC·Filed 2000·Granted Sep 2, 2003·28 cites·10 claims
- 2275US6897440B1Contact hole standard test deviceFAB SOLUTIONS INC·Filed 1999·Granted May 24, 2005·27 cites·27 claims
- 2374US2024213545A1Bipolar Lead-Acid Storage BatteryFURUKAWA BATTERY CO LTD·Filed 2024·Application pending·0 cites
- 2473US5648698AField emission cold cathode element having exposed substrateNEC CORP·Filed 1995·Granted Jul 15, 1997·20 cites·8 claims
- 2572US5496199AElectron beam radiator with cold cathode integral with focusing grid member and process of fabrication thereofNEC CORP·Filed 1995·Granted Mar 5, 1996·22 cites·4 claims
- 2672US2024021841A1Current Collector Sheet For Lead-Acid Storage Battery, Lead-Acid Storage Battery, And Bipolar Lead-Acid Storage BatteryFURUKAWA BATTERY CO LTD·Filed 2023·Application pending·0 cites
- 2772US2024047698A1Lead Foil And Bipolar Lead Acid Storage BatteryFURUKAWA ELECTRIC CO LTD·Filed 2023·Application pending·0 cites
- 2872US2024047697A1Lead Foil And Bipolar Lead Acid Storage BatteryFURUKAWA ELECTRIC CO LTD·Filed 2023·Application pending·0 cites
- 2972US2024014405A1Current Collector Sheet For Lead-Acid Storage Battery, Lead-Acid Storage Battery, And Bipolar Lead-Acid Storage BatteryFURUKAWA BATTERY CO LTD·Filed 2023·Application pending·0 cites
- 3072US2024204263A1Bipolar Storage Battery And Manufacturing Method for Bipolar Storage BatteryFURUKAWA BATTERY CO LTD·Filed 2024·Application pending·0 cites
- 3170US7795593B2Surface contamination analyzer for semiconductor wafersTOPCON CORP·Filed 2008·Granted Sep 14, 2010·2 cites·18 claims
- 3270US7700380B2Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor deviceTOPCON CORP·Filed 2005·Granted Apr 20, 2010·2 cites·13 claims
- 3370US6940296B2Contact hole standard test device, method of forming the same, method of testing contact hole, method and apparatus for measuring a thickness of a film, and method of testing a waferFAB SOLUTIONS INC·Filed 2004·Granted Sep 6, 2005·8 cites·36 claims
- 3470US2023299268A1Lead Alloy, Lead Storage Battery Electrode, Lead Storage Battery, and Power Storage SystemFURUKAWA ELECTRIC CO LTD·Filed 2023·Application pending·0 cites
- 3570US2023299267A1Lead Alloy, Lead Storage Battery Electrode, Lead Storage Battery, and Power Storage SystemFURUKAWA ELECTRIC CO LTD·Filed 2023·Application pending·0 cites
- 3669US6711453B2Production managing system of semiconductor deviceFAB SOLUTIONS INC·Filed 2002·Granted Mar 23, 2004·10 cites·17 claims
- 3768US6967327B2Contact hole standard test device, method of forming the same, method testing contact hole, method and apparatus for measuring a thickness of a film, and method of testing a waferFAB SOLUTIONS INC·Filed 2004·Granted Nov 22, 2005·4 cites·37 claims
- 3868US6943043B2Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor deviceFAB SOLUTIONS INC·Filed 2004·Granted Sep 13, 2005·8 cites·21 claims
- 3968US5656846ASemiconductor acceleration sensor and method of fabrication thereofNEC CORP·Filed 1995·Granted Aug 12, 1997·26 cites·7 claims
- 4066US6982418B2Contact hole standard test device, method of forming the same, method of testing contact hole, method and apparatus for measuring a thickness of a film, and method of testing a waferFAB SOLUTIONS INC·Filed 2004·Granted Jan 3, 2006·3 cites·32 claims
- 4166US2023178712A1Lead Alloy, Positive Electrode for Lead Storage Battery, Lead Storage Battery, and Power Storage SystemFURUKAWA ELECTRIC CO LTD·Filed 2023·Application pending·0 cites
- 4266US2023170464A1Lead Alloy, Positive Electrode for Lead Storage Battery, Lead Storage Battery, and Power Storage SystemFURUKAWA ELECTRIC CO LTD·Filed 2023·Application pending·0 cites
- 4365US2023344013A1Bipolar Battery and Method of Manufacturing the SameFURUKAWA ELECTRIC CO LTD·Filed 2023·Application pending·0 cites
- 4465US2023352800A1Bipolar Battery and Method of Manufacturing the SameFURUKAWA ELECTRIC CO LTD·Filed 2023·Application pending·0 cites
- 4564US7420379B2Semiconductor device test method and semiconductor device testerTOPCON CORP·Filed 2006·Granted Sep 2, 2008·2 cites·16 claims
- 4663US7649341B2Storage battery unitSHIN KOBE ELECTRIC MACHINERY·Filed 2007·Granted Jan 19, 2010·2 cites·14 claims
- 4763US7049834B2Semiconductor device test method and semiconductor device testerFAB SOLUTIONS INC·Filed 2005·Granted May 23, 2006·2 cites·20 claims
- 4860US6842663B2Production managing system of semiconductor deviceFAB SOLUTIONS INC·Filed 2004·Granted Jan 11, 2005·5 cites·11 claims
- 4959US6753194B2Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor deviceFAB SOLUTIONS INC·Filed 2002·Granted Jun 22, 2004·5 cites·6 claims
- 5058US6366055B1Power supply system and state of charge estimating methodSHIN KOBE ELECTRIC MACHINERY·Filed 2001·Granted Apr 2, 2002·16 cites·22 claims
Showing the top 50 of 66 patent records by PatentIndex Score.
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