Inventor · disambiguated record

Mi-Joung Lee

Also filed as: LEE MI-JOUNG

2 granted patents·9 citations·filing 2007–2007

54Inventor score

Technology areasH10P

Files withSAMSUNG ELECTRONICS CO LTD2

Top patents by PatentIndex Score

2 records

0174US7733099B2Monitoring pattern for detecting a defect in a semiconductor device and method for detecting a defectSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Jun 8, 2010·6 cites·12 claims
0264US7705621B2Test pattern and method of monitoring defects using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Apr 27, 2010·3 cites·7 claims

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →