Inventor · disambiguated record
Hirohisa Handa
Also filed as: HANDA HIROHISA
7 granted patents·1 pending application·54 citations·filing 1998–2016
82Inventor score
Top patents by PatentIndex Score
8 records- 0163US6507404B1Method and apparatus for measuring optical wavelengthMITUTOYO CORP·Filed 2000·Granted Jan 14, 2003·11 cites·16 claims
- 0250US6496269B2Shape measuring apparatusMITUTOYO CORP·Filed 2001·Granted Dec 17, 2002·6 cites·7 claims
- 0349US6147764AOptical interference profiler having shadow compensationMITUTOYO CORP OF KAMIYOKOBA·Filed 1999·Granted Nov 14, 2000·19 cites·14 claims
- 0448US5999264AOn-the-fly optical interference measurement device, machining device provided with the measurement device, and machine tool suited to on-the-fly optical measurementMITUTOYO CORP·Filed 1998·Granted Dec 7, 1999·15 cites·15 claims
- 0540US6633387B1Method and apparatus for measuring opposite surfacesMITUTOYO CORP·Filed 2000·Granted Oct 14, 2003·2 cites·15 claims
- 0638US10042151B2Interference objective lens and reference surface unit setMITUTOYO CORP·Filed 2016·Granted Aug 7, 2018·0 cites·4 claims
- 0736US2012056999A1Image measuring device and image measuring methodHANDA HIROHISA·Filed 2011·Application pending·0 cites
- 0830USD666513SRemote probe for a coordinate measuring machineMATSUMIYA SADAYUKI·Filed 2011·Granted Sep 4, 2012·1 cites·1 claims
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