Inventor · disambiguated record
Klaus Bavendiek
Also filed as: BAVENDIEK KLAUS
7 granted patents·2 pending applications·53 citations·filing 2002–2018
80Inventor score
Top patents by PatentIndex Score
9 records- 0187US6687328B2Method for inspecting objects particularly for detecting defects or irregularities therein by means of X-radiation and apparatus for performing the methodYXLON INT X RAY GMBH·Filed 2002·Granted Feb 3, 2004·39 cites·20 claims
- 0282US7522700B2Method for automatic defect recognition in testpieces by means of an X-ray examination unitYXLON INT X RAY GMBH·Filed 2006·Granted Apr 21, 2009·10 cites·10 claims
- 0372US9372270B2X-ray line detector and method for the production thereofYXLON INT GMBH·Filed 2014·Granted Jun 21, 2016·1 cites·14 claims
- 0459US9772259B2Method for calibrating an X-ray testing system for a tire type and method for checking the position of cords in a tireYXLON INT GMBH·Filed 2014·Granted Sep 26, 2017·1 cites·8 claims
- 0550US9322936B2X-ray line detectorYXLON INT GMBH·Filed 2013·Granted Apr 26, 2016·0 cites·23 claims
- 0640US10712291B2Detector with reduced-size edge pixel elementsYXLON INT GMBH·Filed 2018·Granted Jul 14, 2020·0 cites·18 claims
- 0735US6698296B2Use of a cylindrical test bodyYXLON INTERNAT XRAY GMBH·Filed 2002·Granted Mar 2, 2004·2 cites·18 claims
- 0832US2007058848A1Method of determining and correcting non-linear detector pixelsHEIKE UWE·Filed 2006·Application pending·0 cites
- 0929US2018322977A1Anti-scatter filter for an x-ray inspection system, x-ray inspection system and operation of an x-ray inspection systemYXLON INT GMBH·Filed 2018·Application pending·0 cites
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