Inventor · disambiguated record
Tsuneo Nakagomi
Also filed as: NAKAGOMI TSUNEO
8 granted patents·3 pending applications·26 citations·filing 2009–2013
81Inventor score
Top patents by PatentIndex Score
11 records- 0185US8359661B2Magnetic device inspection apparatus and magnetic device inspection methodHITACHI HIGH TECH CORP·Filed 2009·Granted Jan 22, 2013·10 cites·18 claims
- 0281US8299784B2Device for transporting magnetic head, device for inspecting magnetic head, and method for manufacturing magnetic headTOKUTOMI TERUAKI·Filed 2010·Granted Oct 30, 2012·9 cites·8 claims
- 0361US8185968B2Magnetic head inspection method and magnetic head manufacturing methodNAKAGOMI TSUNEO·Filed 2011·Granted May 22, 2012·3 cites·8 claims
- 0460US8713710B2Cantilever of scanning probe microscope and method for manufacturing the same, method for inspecting thermal assist type magnetic head device and its apparatusHITACHI HIGH TECH CORP·Filed 2012·Granted Apr 29, 2014·1 cites·14 claims
- 0560US8483035B2Thermally assisted magnetic recording head inspection method and apparatusZHANG KAIFENG·Filed 2012·Granted Jul 9, 2013·1 cites·11 claims
- 0657US8278917B2Magnetic head inspection method and magnetic head inspection deviceNAKAGOMI TSUNEO·Filed 2009·Granted Oct 2, 2012·2 cites·5 claims
- 0756US8787134B2Thermally assisted magnetic recording head inspection method and apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted Jul 22, 2014·0 cites·10 claims
- 0848US2012324720A1Magnetic head manufacturing methodNAKAGOMI TSUNEO·Filed 2012·Application pending·0 cites
- 0943US8621659B2Cantilever for magnetic force microscope and method of manufacturing the sameZHANG KAIFENG·Filed 2012·Granted Dec 31, 2013·0 cites·11 claims
- 1038US2014090117A1Magnetic head inspection system and magnetic head inspection methodHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
- 1132US2012054924A1SPM Probe and Inspection Device for Light Emission UnitZHANG KAIFENG·Filed 2011·Application pending·0 cites
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