Inventor · disambiguated record
Sung-Gun Kang
Also filed as: KANG SUNG-GUN
9 granted patents·1 pending application·25 citations·filing 2004–2019
82Inventor score
Files withSAMSUNG ELECTRONICS CO LTD10
Top patents by PatentIndex Score
10 records- 0183US7846790B2Method of fabricating semiconductor device having multiple gate dielectric layers and semiconductor device fabricated therebySAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Dec 7, 2010·10 cites·16 claims
- 0268US7732280B2Semiconductor device having offset spacer and method of forming the sameSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Jun 8, 2010·3 cites·10 claims
- 0367US10622265B2Method of detecting failure of a semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Apr 14, 2020·1 cites·20 claims
- 0466US7358588B2Trench isolation type semiconductor device which prevents a recess from being formed in a field regionSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Apr 15, 2008·3 cites·6 claims
- 0559US10600702B2Test element group and semiconductor wafer including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Mar 24, 2020·0 cites·20 claims
- 0657US7795110B2Trench isolation type semiconductor device which prevents a recess from being formed in a field region and method of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Sep 14, 2010·1 cites·12 claims
- 0755US7288848B2Overlay mark for measuring and correcting alignment errorsSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Oct 30, 2007·7 cites·34 claims
- 0853US2005156199A1Method of forming a CMOS deviceSAMSUNG ELECTRONICS CO LTD·Filed 2005·Application pending·0 cites
- 0944US7553606B2Methods of forming patterns in semiconductor devices using photo resist patternsSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Jun 30, 2009·0 cites·14 claims
- 1039US7485558B2Method of manufacturing semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Feb 3, 2009·0 cites·10 claims
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