Inventor · disambiguated record
Ghilgeun Oh
Also filed as: OH GHILGEUN
2 granted patents·0 citations·filing 2021–2023
23Inventor score
Files withSAMSUNG ELECTRONICS CO LTD2
Top patents by PatentIndex Score
2 records- 0152US12379328B2Inspection system and inspection method for semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Aug 5, 2025·0 cites·20 claims
- 0247US12265778B2Method of detecting defective layer of semiconductor device and computing system for performing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Apr 1, 2025·0 cites·20 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →