Inventor · disambiguated record
Ken Hanh Duc Lai
Also filed as: LAI KEN HANH DUC
4 granted patents·2 pending applications·31 citations·filing 2000–2014
68Inventor score
Top patents by PatentIndex Score
6 records- 0177US6748562B1Memory tester omits programming of addresses in detected bad columnsAGILENT TECHNOLOGIES INC·Filed 2000·Granted Jun 8, 2004·28 cites·2 claims
- 0262US9330792B2Testing memory devices with distributed processing operationsADVANTEST CORP·Filed 2014·Granted May 3, 2016·3 cites·20 claims
- 0339US9612272B2Testing memory devices with parallel processing operationsADVANTEST CORP·Filed 2014·Granted Apr 4, 2017·0 cites·20 claims
- 0435US2015255175A1Memory testing and failure data filteringADVANTEST CORP·Filed 2014·Application pending·0 cites
- 0535US2015255176A1Memory test ecc auto-correction of failing dataADVANTEST CORP·Filed 2014·Application pending·0 cites
- 0634US9557372B2Tester having an application specific electronics module, and systems and methods that incorporate or use the sameDE LA PUENTE EDMUNDO·Filed 2010·Granted Jan 31, 2017·0 cites·18 claims
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