Inventor · disambiguated record
Ha Min Sung
Also filed as: SUNG HA MIN
8 granted patents·1 pending application·77 citations·filing 1996–2013
86Inventor score
Files withHYNIX SEMICONDUCTOR INC3HYUNDAI ELECTRONICS IND2LG SEMICON CO LTD2LEE HAE UK1SK HYNIX INC1
Top patents by PatentIndex Score
9 records- 0164US5708607AData read circuit of a memoryLG SEMICON CO LTD·Filed 1996·Granted Jan 13, 1998·24 cites·9 claims
- 0258US6657903B2Circuit for generating power-up signalHYNIX SEMICONDUCTOR INC·Filed 2001·Granted Dec 2, 2003·11 cites·6 claims
- 0358US6570796B2Wafer burn-in test and wafer test circuitHYNIX SEMICONDUCTOR INC·Filed 2001·Granted May 27, 2003·10 cites·6 claims
- 0455US6711077B2Wafer burn-in test and wafer test circuitHYNIX SEMICONDUCTOR INC·Filed 2003·Granted Mar 23, 2004·8 cites·1 claims
- 0546US8952735B2Integrated circuitSK HYNIX INC·Filed 2013·Granted Feb 10, 2015·0 cites·16 claims
- 0646US6281742B1Substrate voltage detection control circuitHYUNDAI ELECTRONICS IND·Filed 1999·Granted Aug 28, 2001·13 cites·12 claims
- 0741US6198344B1Back bias voltage level sensing circuitHYUNDAI ELECTRONICS IND·Filed 1999·Granted Mar 6, 2001·7 cites·5 claims
- 0834US6147512AInput buffer circuitLG SEMICON CO LTD·Filed 1999·Granted Nov 14, 2000·4 cites·13 claims
- 0926US2013093472A1Semiconductor integrated circuitLEE HAE UK·Filed 2011·Application pending·0 cites
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