Inventor · disambiguated record
Sharad Saxena
Also filed as: SAXENA SHARAD
23 granted patents·1,135 citations·filing 1993–2023
97Inventor score
Top patents by PatentIndex Score
23 records- 0193US5642296AMethod of diagnosing malfunctions in semiconductor manufacturing equipmentTEXAS INSTRUMENTS INC·Filed 1993·Granted Jun 24, 1997·164 cites·21 claims
- 0293US5408405AMulti-variable statistical process controller for discrete manufacturingTEXAS INSTRUMENTS INC·Filed 1993·Granted Apr 18, 1995·253 cites·20 claims
- 0389US5546312AUse of spatial models for simultaneous control of various non-uniformity metricsTEXAS INSTRUMENTS INC·Filed 1994·Granted Aug 13, 1996·97 cites·17 claims
- 0488US6978229B1Efficient method for modeling and simulation of the impact of local and global variation on integrated circuitsPDF SOLUTIONS INC·Filed 2000·Granted Dec 20, 2005·53 cites·6 claims
- 0585US5751582AControlling process modules using site models and monitor wafer controlTEXAS INSTRUMENTS INC·Filed 1996·Granted May 12, 1998·97 cites·21 claims
- 0683US6381564B1Method and system for using response-surface methodologies to determine optimal tuning parameters for complex simulatorsTEXAS INSTRUMENTS INC·Filed 1999·Granted Apr 30, 2002·112 cites·20 claims
- 0782US10529631B1Test structures and method for electrical measurement of FinFET fin heightPDF SOLUTIONS INC·Filed 2016·Granted Jan 7, 2020·3 cites·16 claims
- 0881US7644388B1Method for reducing layout printability effects on semiconductor device performancePDF SOLUTIONS INC·Filed 2006·Granted Jan 5, 2010·9 cites·20 claims
- 0980US7003742B2Methodology for the optimization of testing and diagnosis of analog and mixed signal ICs and embedded coresPDF SOLUTIONS INC·Filed 2003·Granted Feb 21, 2006·26 cites·14 claims
- 1078US9691669B1Test structures and methods for measuring silicon thickness in fully depleted silicon-on-insulator technologiesPDF SOLUTIONS·Filed 2015·Granted Jun 27, 2017·4 cites·10 claims
- 1177US9952268B1Method for accurate measurement of leaky capacitors using charge based capacitance measurementsPDF SOLUTIONS INC·Filed 2016·Granted Apr 24, 2018·3 cites·15 claims
- 1273US7932105B1Systems and methods for detecting and monitoring nickel-silicide process and induced failuresPDF SOLUTIONS·Filed 2008·Granted Apr 26, 2011·7 cites·8 claims
- 1373US6530064B1Method and apparatus for predicting an operational lifetime of a transistorTEXAS INSTRUMENTS INC·Filed 2000·Granted Mar 4, 2003·20 cites·8 claims
- 1469US7047505B2Method for optimizing the characteristics of integrated circuits components from circuit specificationsPDF SOLUTIONS INC·Filed 2001·Granted May 16, 2006·19 cites·16 claims
- 1565US6157062AIntegrating dual supply voltage by removing the drain extender implant from the high voltage deviceTEXAS INSTRUMENTS INC·Filed 1999·Granted Dec 5, 2000·25 cites·14 claims
- 1663US5912678AProcess flow design at the module effects level through the use of acceptability regionsTEXAS INSTRUMENTS INC·Filed 1997·Granted Jun 15, 1999·149 cites·13 claims
- 1755US12416663B1Embedded system to characterize BTI degradation effects in MOSFETsQUARANTELLI MICHELE·Filed 2023·Granted Sep 16, 2025·0 cites·11 claims
- 1855US5483636AAutomated diagnosis using wafer tracking databasesTEXAS INSTRUMENTS INC·Filed 1995·Granted Jan 9, 1996·21 cites·24 claims
- 1950US6388288B1Integrating dual supply voltages using a single extra mask levelTEXAS INSTRUMENTS INC·Filed 1999·Granted May 14, 2002·13 cites·18 claims
- 2048US10852337B2Test structures for measuring silicon thickness in fully depleted silicon-on-insulator technologiesPDF SOLUTIONS INC·Filed 2017·Granted Dec 1, 2020·0 cites·8 claims
- 2145US10641804B1Method for applying charge-based-capacitance-measurement with switches using only NMOS or only PMOS transistorsPDF SOLUTIONS INC·Filed 2016·Granted May 5, 2020·0 cites·16 claims
- 2244US6311096B1Design of microelectronic process flows for manufacturability and performanceTEXAS INSTRUMENTS INC·Filed 1999·Granted Oct 30, 2001·46 cites·12 claims
- 2341US6317640B1System and method for non-parametric modeling of processed induced variabilityTEXAS INSTRUMENTS INC·Filed 1999·Granted Nov 13, 2001·14 cites·7 claims
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