Inventor · disambiguated record
Ho-Bong Shin
Also filed as: SHIN HO-BONG
4 granted patents·57 citations·filing 2004–2014
68Inventor score
Top patents by PatentIndex Score
4 records- 0189US8711348B2Method of inspecting waferJANG HWAN-SEOK·Filed 2011·Granted Apr 29, 2014·57 cites·11 claims
- 0249US8976348B2Wafer inspection systemSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Mar 10, 2015·0 cites·11 claims
- 0344US7271080B2Electrically erasable programmable read only memory (EEPROM) cells and methods of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Sep 18, 2007·0 cites·11 claims
- 0436US7019354B2Electrically erasable programmable read only memory (EEPROM) cells and methods of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Mar 28, 2006·0 cites·6 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →