Inventor · disambiguated record
Parag Madhani
Also filed as: MADHANI PARAG · MADHANI PARAG N
6 granted patents·2 pending applications·13 citations·filing 2006–2014
74Inventor score
Top patents by PatentIndex Score
8 records- 0182US8566658B2Low-power and area-efficient scan cell for integrated circuit testingTEKUMALLA RAMESH C·Filed 2011·Granted Oct 22, 2013·6 cites·22 claims
- 0266US8793546B2Integrated circuit comprising scan test circuitry with parallel reordered scan chainsTEKUMALLA RAMESH C·Filed 2011·Granted Jul 29, 2014·2 cites·15 claims
- 0361US7271485B1Systems and methods for distributing I/O in a semiconductor deviceAGERE SYSTEMS INC·Filed 2006·Granted Sep 18, 2007·3 cites·18 claims
- 0457US7709861B2Systems and methods for supporting a subset of multiple interface types in a semiconductor deviceAGERE SYSTEMS INC·Filed 2007·Granted May 4, 2010·2 cites·20 claims
- 0545US2016020158A1Systems and Methods for Self Test Circuit SecurityLSI CORP·Filed 2014·Application pending·0 cites
- 0638US9348593B2Instruction address encoding and decoding based on program construct groupsKRISHNAMOORTHY PRAKASH·Filed 2012·Granted May 24, 2016·0 cites·20 claims
- 0733US8711013B2Coding circuitry for difference-based data transformationKRISHNAMOORTHY PRAKASH·Filed 2012·Granted Apr 29, 2014·0 cites·26 claims
- 0832US2013275824A1Scan-based capture and shift of interface functional signal values in conjunction with built-in self-testTEKUMALLA RAMESH C·Filed 2012·Application pending·0 cites
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