Inventor · disambiguated record
Doron Meshulach
Also filed as: MESHULACH DORON
16 granted patents·1 pending application·447 citations·filing 1998–2011
94Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD8BERLATZKY YOAV2MESHULACH DORON2REDC OPTICAL NETWORKS LTD2YEDA RES & DEV2
Top patents by PatentIndex Score
17 records- 0195US6621613B2Adaptive pulse compressorYEDA RES & DEV·Filed 2001·Granted Sep 16, 2003·52 cites·7 claims
- 0295US6519082B2Apparatus and method for a self-adjusting Raman amplifierREDC OPTICAL NETWORKS LTD·Filed 2002·Granted Feb 11, 2003·128 cites·35 claims
- 0394US7468507B2Optical spot grid array scanning systemAPPLIED MATERIALS ISRAEL LTD·Filed 2006·Granted Dec 23, 2008·37 cites·18 claims
- 0493US6433922B1Apparatus and method for a self adjusting Raman amplifierREDC OPTICAL NETWORKS LTD·Filed 2001·Granted Aug 13, 2002·76 cites·27 claims
- 0591US6327068B1Adaptive pulse compressorYEDA RES & DEV·Filed 1998·Granted Dec 4, 2001·82 cites·19 claims
- 0689US7521700B2Raster frame beam system for electron beam lithographyAPPLIED MATERIALS ISRAEL LTD·Filed 2006·Granted Apr 21, 2009·10 cites·12 claims
- 0786US7842935B2Raster frame beam system for electron beam lithographyAPPLIED MATERIALS ISRAEL LTD·Filed 2006·Granted Nov 30, 2010·7 cites·66 claims
- 0886US7684048B2Scanning microscopyAPPLIED MATERIALS ISRAEL LTD·Filed 2006·Granted Mar 23, 2010·12 cites·14 claims
- 0979US7990546B2High throughput across-wafer-variation mappingAPPLIED MATERIALS ISRAEL LTD·Filed 2008·Granted Aug 2, 2011·6 cites·19 claims
- 1078US7098468B2Raster frame beam system for electron beam lithographyAPPLIED MATERIALS INC·Filed 2003·Granted Aug 29, 2006·14 cites·66 claims
- 1177US8614790B2Optical system and method for inspection of patterned samplesBERLATZKY YOAV·Filed 2011·Granted Dec 24, 2013·9 cites·9 claims
- 1267US7846649B2High resolution printer and a method for high resolution printingAPPLIED MATERIALS ISRAEL LTD·Filed 2004·Granted Dec 7, 2010·9 cites·13 claims
- 1363US8724882B2Mapping variations of a surfaceMESHULACH DORON·Filed 2009·Granted May 13, 2014·2 cites·23 claims
- 1452US8228601B2Scanning microscopy using inhomogeneous polarizationMESHULACH DORON·Filed 2009·Granted Jul 24, 2012·2 cites·22 claims
- 1541US7341823B2System and method for printing a patternAPPLIED MATERIALS ISRAEL LTD·Filed 2004·Granted Mar 11, 2008·1 cites·9 claims
- 1637US7576348B2One-dimensional phase contrast microscopy with a traveling lens generated by a step function changeAPPLIED MATERIALS ISRAEL LTD·Filed 2007·Granted Aug 18, 2009·0 cites·36 claims
- 1729US2013148115A1Optical system and method for inspection of patterned samplesBERLATZKY YOAV·Filed 2011·Application pending·0 cites
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