Inventor · disambiguated record
Nobuyuki Harabe
Also filed as: HARABE NOBUYUKI
2 granted patents·4 pending applications·4 citations·filing 2005–2025
47Inventor score
Top patents by PatentIndex Score
6 records- 0154US7627164B2Pattern inspection method and apparatus with high-accuracy pattern image correction capabilityADVANCED MASK INSPECTION TECH·Filed 2006·Granted Dec 1, 2009·2 cites·8 claims
- 0251US2025292164A1Analysis device, analysis system, analysis method, program, and workwearNEC CORP·Filed 2025·Application pending·0 cites
- 0343US8094926B2Ultrafine pattern discrimination using transmitted/reflected workpiece images for use in lithography inspection systemHARABE NOBUYUKI·Filed 2009·Granted Jan 10, 2012·2 cites·6 claims
- 0431US2007053583A1Image correcting apparatus, pattern inspection apparatus, and image correcting method, and reticleADVANCED MASK INSPECTION TECH·Filed 2005·Application pending·0 cites
- 0531US2007052960A1Reference image forming apparatus, pattern inspection apparatus, and reference image forming method, and reticleADVANCED MASK INSPECTION TECH·Filed 2005·Application pending·0 cites
- 0630US2007053578A1Pattern inspection apparatus and method and reticle for use thereinADVANCED MASK INSPECTION TECH·Filed 2005·Application pending·0 cites
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