Inventor · disambiguated record
Mikio Asakura
Also filed as: ASAKURA MIKIO
102 granted patents·2 pending applications·3,037 citations·filing 1988–2016
99Inventor score
Files withMITSUBISHI ELECTRIC CORP97RENESAS TECH CORP4TOYO SEIKAN KAISHA LTD2MITSUBSHI DENKI KABUSHIKI KAIS1
Top patents by PatentIndex Score
104 records- 0196US6400621B2Semiconductor memory device and method of checking same for defectMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Jun 4, 2002·78 cites·6 claims
- 0296US5495440ASemiconductor memory device having hierarchical bit line structureMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Feb 27, 1996·151 cites·29 claims
- 0395US5226147ASemiconductor memory device for simple cache systemMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Jul 6, 1993·102 cites·19 claims
- 0493US5838627AArrangement of power supply and data input/output pads in semiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Nov 17, 1998·92 cites·32 claims
- 0593US5687123ASemiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Nov 11, 1997·66 cites·42 claims
- 0692US5970507ASemiconductor memory device having a refresh-cycle program circuitMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Oct 19, 1999·102 cites·15 claims
- 0792US5604710AArrangement of power supply and data input/output pads in semiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Feb 18, 1997·82 cites·50 claims
- 0891US5249155ASemiconductor device incorporating internal voltage down converting circuitMITSUBISHI ELECTRIC CORP·Filed 1992·Granted Sep 28, 1993·81 cites·35 claims
- 0991US5179687ASemiconductor memory device containing a cache and an operation method thereofMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Jan 12, 1993·165 cites·16 claims
- 1090US6166989AClock synchronous type semiconductor memory device that can switch word configurationMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Dec 26, 2000·71 cites·29 claims
- 1189US6551846B1Semiconductor memory device capable of correctly and surely effecting voltage stress accelerationMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Apr 22, 2003·48 cites·7 claims
- 1288US6377512B1Clock synchronous type semiconductor memory device that can switch word configurationMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Apr 23, 2002·42 cites·14 claims
- 1388US5509132ASemiconductor memory device having an SRAM as a cache memory integrated on the same chip and operating method thereofMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Apr 16, 1996·124 cites·35 claims
- 1488US5325336ASemiconductor memory device having power line arranged in a meshed shapeMITSUBISHI ELECTRIC CORP·Filed 1992·Granted Jun 28, 1994·47 cites·20 claims
- 1588US5321646ALayout of a semiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 1992·Granted Jun 14, 1994·68 cites·40 claims
- 1687US4926385ASemiconductor memory device with cache memory addressable by block within each columnMITSUBISHI ELECTRIC CORP·Filed 1988·Granted May 15, 1990·91 cites·7 claims
- 1786US5953261ASemiconductor memory device having data input/output circuit of small occupied area capable of high-speed data input/outputMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Sep 14, 1999·55 cites·7 claims
- 1885US6295238B1Semiconductor memory device having a circuit for fast operationMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Sep 25, 2001·29 cites·8 claims
- 1985US5917766ASemiconductor memory device that can carry out read disturb testing and burn-in testing reliablyMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Jun 29, 1999·58 cites·17 claims
- 2085USRE36089EColumn selecting circuit in semiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Feb 9, 1999·52 cites·14 claims
- 2184US5793686ASemiconductor memory device having data input/output circuit of small occupied area capable of high-speed data input/outputMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Aug 11, 1998·49 cites·11 claims
- 2284US5353427ASemiconductor memory device for simple cache system with selective coupling of bit line pairsMITSUBISHI ELECTRIC CORP·Filed 1993·Granted Oct 4, 1994·39 cites·22 claims
- 2383US5682343AHierarchical bit line arrangement in a semiconductor memoryMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Oct 28, 1997·54 cites·26 claims
- 2482US6301169B1Semiconductor memory device with IO compression test modeMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Oct 9, 2001·31 cites·10 claims
- 2581US5715189ASemiconductor memory device having hierarchical bit line arrangementMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Feb 3, 1998·51 cites·4 claims
- 2680US6414883B2Semiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Jul 2, 2002·18 cites·3 claims
- 2778US5650972ASemiconductor memory device having power line arranged in a meshed shapeMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Jul 22, 1997·27 cites·8 claims
- 2877US5588130ASemiconductor memory device for simple cache systemMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Dec 24, 1996·50 cites·27 claims
- 2977US4914632ASemiconductor devices having redundancy circuitry and operating method thereforMITSUBISHI ELECTRIC CORP·Filed 1988·Granted Apr 3, 1990·33 cites·18 claims
- 3076US5943273ASemiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Aug 24, 1999·23 cites·23 claims
- 3176US5828258ASemiconductor device and testing apparatus thereofMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Oct 27, 1998·30 cites·11 claims
- 3274US5867439ASemiconductor memory device having internal address converting function, whose test and layout are conducted easilyMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Feb 2, 1999·30 cites·6 claims
- 3374US5650975ASemiconductor memory device having improved hierarchical I/O line pair structureMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Jul 22, 1997·36 cites·8 claims
- 3472US6207998B1Semiconductor device with well of different conductivity typesMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Mar 27, 2001·32 cites·16 claims
- 3571US6477105B2Semiconductor memory device with a hierarchical word line configuration capable of preventing leakage current in a sub-word line driverMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Nov 5, 2002·16 cites·11 claims
- 3671US5859799ASemiconductor memory device including internal power supply circuit generating a plurality of internal power supply voltages at different levelsMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Jan 12, 1999·32 cites·6 claims
- 3771US5760614APotential detecting circuit and semiconductor integrated circuitMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Jun 2, 1998·21 cites·20 claims
- 3871US5716889AMethod of arranging alignment marksMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Feb 10, 1998·40 cites·3 claims
- 3971US5652730ASemiconductor memory device having hierarchical boosted power-line schemeMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Jul 29, 1997·31 cites·19 claims
- 4071US5014241ADynamic semiconductor memory device having reduced soft error rateMITSUBISHI ELECTRIC CORP·Filed 1989·Granted May 7, 1991·25 cites·12 claims
- 4169US6690241B2Ring oscillator having variable capacitance circuits for frequency adjustmentMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Feb 10, 2004·13 cites·1 claims
- 4269US6327198B1Semiconductor memory device having a test mode setting circuitMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Dec 4, 2001·17 cites·14 claims
- 4369US5815454ASemiconductor memory device having power line arranged in a meshed shapeMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Sep 29, 1998·17 cites·29 claims
- 4468US6762967B2Semiconductor memory device having a circuit for fast operationRENESAS TECH CORP·Filed 2003·Granted Jul 13, 2004·12 cites·2 claims
- 4568US6687174B2Semiconductor memory device capable of switching output data widthRENESAS TECH CORP·Filed 2003·Granted Feb 3, 2004·14 cites·4 claims
- 4668US5226139ASemiconductor memory device with a built-in cache memory and operating method thereofMITSUBISHI ELECTRIC CORP·Filed 1991·Granted Jul 6, 1993·50 cites·22 claims
- 4768US4953164ACache memory system having error correcting circuitMITSUBISHI ELECTRIC CORP·Filed 1988·Granted Aug 28, 1990·38 cites·12 claims
- 4867US6535412B1Semiconductor memory device capable of switching output data widthMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Mar 18, 2003·14 cites·8 claims
- 4967US6003148ASemiconductor memory device allowing repair of a defective memory cell with a redundant circuit in a multibit test modeMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Dec 14, 1999·23 cites·24 claims
- 5066US6614713B2Semiconductor memory device having a circuit for fast operationMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Sep 2, 2003·11 cites·4 claims
Showing the top 50 of 104 patent records by PatentIndex Score.
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