Inventor · disambiguated record
Donald L. Wollesen
Also filed as: WOLLESEN DONALD · WOLLESEN DONALD L
54 granted patents·1 pending application·2,795 citations·filing 1979–2001
99Inventor score
Top patents by PatentIndex Score
55 records- 0199US5659201AHigh conductivity interconnection lineADVANCED MICRO DEVICES INC·Filed 1995·Granted Aug 19, 1997·412 cites·26 claims
- 0297US6395437B1Junction profiling using a scanning voltage micrographADVANCED MICRO DEVICES INC·Filed 2000·Granted May 28, 2002·103 cites·20 claims
- 0397US6163052ATrench-gated vertical combination JFET and MOSFET devicesADVANCED MICRO DEVICES INC·Filed 1997·Granted Dec 19, 2000·192 cites·13 claims
- 0495US5877667AOn-chip transformersADVANCED MICRO DEVICES INC·Filed 1996·Granted Mar 2, 1999·75 cites·5 claims
- 0593US6515344B1Thin oxide anti-fuseADVANCED MICRO DEVICES INC·Filed 2000·Granted Feb 4, 2003·82 cites·8 claims
- 0693US6215155B1Silicon-on-insulator configuration which is compatible with bulk CMOS architectureADVANCED MICRO DEVICES INC·Filed 1999·Granted Apr 10, 2001·114 cites·9 claims
- 0793US6201761B1Field effect transistor with controlled body biasADVANCED MICRO DEVICES INC·Filed 2000·Granted Mar 13, 2001·79 cites·20 claims
- 0892US6020222ASilicon oxide insulator (SOI) semiconductor having selectively linked bodyADVANCED MICRO DEVICES INC·Filed 1997·Granted Feb 1, 2000·80 cites·17 claims
- 0992US5960271AShort channel self-aligned VMOS field effect transistorADVANCED MICRO DEVICES INC·Filed 1998·Granted Sep 28, 1999·107 cites·17 claims
- 1091US5900668ALow capacitance interconnectionADVANCED MICRO DEVICES INC·Filed 1995·Granted May 4, 1999·110 cites·5 claims
- 1191US5015595AMethod of making a high performance MOS device having both P- and N-LDD regions using single photoresist maskADVANCED MICRO DEVICES INC·Filed 1988·Granted May 14, 1991·71 cites·19 claims
- 1287US5864158ATrench-gated vertical CMOS deviceADVANCED MICRO DEVICES INC·Filed 1997·Granted Jan 26, 1999·63 cites·19 claims
- 1386US5994738ASilicon oxide insulator (SOI) semiconductor having selectively linked bodyADVANCED MICRO DEVICES INC·Filed 1999·Granted Nov 30, 1999·49 cites·19 claims
- 1486US5824586AMethod of manufacturing a raised source/drain MOSFETADVANCED MICRO DEVICES INC·Filed 1996·Granted Oct 20, 1998·66 cites·8 claims
- 1585US6124608ANon-volatile trench semiconductor device having a shallow drain regionADVANCED MICRO DEVICES INC·Filed 1997·Granted Sep 26, 2000·68 cites·28 claims
- 1684US5808340AShort channel self aligned VMOS field effect transistorADVANCED MICRO DEVICES INC·Filed 1996·Granted Sep 15, 1998·58 cites·10 claims
- 1784US5712510AReduced electromigration interconnection lineADVANCED MICRO DEVICES INC·Filed 1995·Granted Jan 27, 1998·78 cites·5 claims
- 1883US6147378AFully recessed semiconductor device and method for low power applications with single wrap around buried drain regionADVANCED MICRO DEVICES INC·Filed 1998·Granted Nov 14, 2000·49 cites·14 claims
- 1983US6146985ALow capacitance interconnectionADVANCED MICRO DEVICES INC·Filed 1998·Granted Nov 14, 2000·59 cites·25 claims
- 2083US4306916ACMOS P-Well selective implant methodAMERICAN MICRO SYST·Filed 1979·Granted Dec 22, 1981·44 cites·10 claims
- 2182US6150693AShort channel non-self aligned VMOS field effect transistorADVANCED MICRO DEVICES INC·Filed 1998·Granted Nov 21, 2000·53 cites·7 claims
- 2281US6225667B1Leaky lower interface for reduction of floating body effect in SOI devicesADVANCED MICRO DEVICES INC·Filed 2000·Granted May 1, 2001·24 cites·18 claims
- 2381US5904528AMethod of forming asymmetrically doped source/drain regionsADVANCED MICRO DEVICES INC·Filed 1997·Granted May 18, 1999·54 cites·2 claims
- 2481US5804470AMethod of making a selective epitaxial growth circuit load elementADVANCED MICRO DEVICES INC·Filed 1996·Granted Sep 8, 1998·61 cites·9 claims
- 2578US6348356B1Method and apparatus for determining the robustness of memory cells to alpha-particle/cosmic ray induced soft errorsADVANCED MICRO DEVICES INC·Filed 2000·Granted Feb 19, 2002·23 cites·12 claims
- 2678US6242329B1Method for manufacturing asymmetric channel transistorADVANCED MICRO DEVICES INC·Filed 1999·Granted Jun 5, 2001·57 cites·8 claims
- 2778US5847821AUse of fiducial marks for improved blank wafer defect reviewADVANCED MICRO DEVICES INC·Filed 1997·Granted Dec 8, 1998·51 cites·8 claims
- 2876US5828110ALatchup-proof I/O circuit implementationADVANCED MICRO DEVICES INC·Filed 1996·Granted Oct 27, 1998·38 cites·13 claims
- 2975US6188306B1On-chip transformersADVANCED MICRO DEVICES INC·Filed 1997·Granted Feb 13, 2001·24 cites·2 claims
- 3075US5991134ASwitchable ESD protective shunting circuit for semiconductor devicesADVANCED MICRO DEVICES INC·Filed 1997·Granted Nov 23, 1999·49 cites·34 claims
- 3175US5923063ADouble density V nonvolatile memory cellADVANCED MICRO DEVICES INC·Filed 1998·Granted Jul 13, 1999·38 cites·26 claims
- 3274US5689139AEnhanced electromigration lifetime of metal interconnection linesADVANCED MICRO DEVICES INC·Filed 1995·Granted Nov 18, 1997·48 cites·8 claims
- 3373US6002151ANon-volatile trench semiconductor deviceADVANCED MICRO DEVICES INC·Filed 1997·Granted Dec 14, 1999·35 cites·3 claims
- 3472US5990515ATrenched gate non-volatile semiconductor device and method with corner doping and sidewall dopingADVANCED MICRO DEVICES INC·Filed 1998·Granted Nov 23, 1999·32 cites·17 claims
- 3571US6097061ATrenched gate metal oxide semiconductor device and methodADVANCED MICRO DEVICES INC·Filed 1998·Granted Aug 1, 2000·26 cites·17 claims
- 3670US6764904B1Trenched gate non-volatile semiconductor method with the source/drain regions spaced from the trench by sidewall dopingsADVANCED MICRO DEVICES INC·Filed 2000·Granted Jul 20, 2004·13 cites·9 claims
- 3770US6309919B1Method for fabricating a trench-gated vertical CMOS deviceADVANCED MICRO DEVICES INC·Filed 1999·Granted Oct 30, 2001·26 cites·20 claims
- 3865US6667227B1Trenched gate metal oxide semiconductor device and methodADVANCED MICRO DEVICES INC·Filed 2000·Granted Dec 23, 2003·10 cites·4 claims
- 3962US6417030B1Leaky lower interface for reduction of floating body effect in SOI devicesADVANCED MICRO DEVICES INC·Filed 2001·Granted Jul 9, 2002·8 cites·30 claims
- 4061US5972725ADevice analysis for face down chipADVANCED MICRO DEVICES INC·Filed 1997·Granted Oct 26, 1999·25 cites·5 claims
- 4158US6627952B1Silicon oxide insulator (SOI) semiconductor having selectively linked bodyADVANCED MICRO DEVICES INC·Filed 1999·Granted Sep 30, 2003·13 cites·3 claims
- 4257US6285054B1Trenched gate non-volatile semiconductor device with the source/drain regions spaced from the trench by sidewall dopingsADVANCED MICRO DEVICES INC·Filed 1998·Granted Sep 4, 2001·14 cites·12 claims
- 4357US6140186AMethod of forming asymmetrically doped source/drain regionsADVANCED MICRO DEVICES INC·Filed 1998·Granted Oct 31, 2000·19 cites·22 claims
- 4456US5856708APolycide/poly diode SRAM loadADVANCED MICRO DEVICES INC·Filed 1996·Granted Jan 5, 1999·16 cites·3 claims
- 4555US6664797B1Method for profiling semiconductor device junctions using a voltage contrast scanning electron microscopeADVANCED MICRO DEVICES INC·Filed 2000·Granted Dec 16, 2003·6 cites·19 claims
- 4651US5999465AMethod and apparatus for determining the robustness of memory cells to alpha-particle/cosmic ray induced soft errorsADVANCED MICRO DEVICES INC·Filed 1998·Granted Dec 7, 1999·12 cites·20 claims
- 4750US6093331ABackside silicon removal for face down chip analysisADVANCED MICRO DEVICES INC·Filed 1997·Granted Jul 25, 2000·14 cites·6 claims
- 4847US6204516B1Method and apparatus for determining the robustness of memory cells to alpha-particle/cosmic ray induced soft errorsADVANCED MICRO DEVICES INC·Filed 1998·Granted Mar 20, 2001·9 cites·7 claims
- 4945US5982691AMethod and apparatus for determining the robustness of memory cells to induced soft errors using equivalent diodesADVANCED MICRO DEVICES INC·Filed 1998·Granted Nov 9, 1999·9 cites·21 claims
- 5044US6225161B1Fully recessed semiconductor method for low power applications with single wrap around buried drain regionADVANCED MICRO DEVICES INC·Filed 1999·Granted May 1, 2001·7 cites·23 claims
Showing the top 50 of 55 patent records by PatentIndex Score.
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