Inventor · disambiguated record
Ajharali Amanullah
Also filed as: AMANULLAH AJHARALI
11 granted patents·1 pending application·38 citations·filing 2007–2018
87Inventor score
Files withAMANULLAH AJHARALI6ASTI HOLDINGS LTD3SEMICONDUCTOR TECH AND INSTRUMENTS PTE LTD2SEMICONDUCTOR TECH & INSTRUMENTS PTE LTD1
Top patents by PatentIndex Score
12 records- 0184US10876975B2System and method for inspecting a waferSEMICONDUCTOR TECH & INSTRUMENTS PTE LTD·Filed 2018·Granted Dec 29, 2020·4 cites·14 claims
- 0281US9816938B2Apparatus and method for selectively inspecting component sidewallsSEMICONDUCTOR TECH AND INSTRUMENTS PTE LTD·Filed 2014·Granted Nov 14, 2017·6 cites·28 claims
- 0379US8885918B2System and method for inspecting a waferAMANULLAH AJHARALI·Filed 2010·Granted Nov 11, 2014·9 cites·22 claims
- 0473US10504761B2Method system for generating 3D composite images of objects and determining object properties based thereonSEMICONDUCTOR TECH AND INSTRUMENTS PTE LTD·Filed 2018·Granted Dec 10, 2019·2 cites·18 claims
- 0573US9863889B2System and method for inspecting a waferAMANULLAH AJHARALI·Filed 2010·Granted Jan 9, 2018·4 cites·25 claims
- 0672US9934565B2Systems and methods for automatically verifying correct die removal from film framesASTI HOLDINGS LTD·Filed 2014·Granted Apr 3, 2018·5 cites·25 claims
- 0771US9746426B2System and method for capturing illumination reflected in multiple directionsAMANULLAH AJHARALI·Filed 2011·Granted Aug 29, 2017·2 cites·22 claims
- 0862US7869021B2Multiple surface inspection system and methodASTI HOLDINGS LTD·Filed 2008·Granted Jan 11, 2011·2 cites·23 claims
- 0959US10161881B2System and method for inspecting a waferAMANULLAH AJHARALI·Filed 2010·Granted Dec 25, 2018·1 cites·28 claims
- 1059US8401272B2Patterned wafer defect inspection system and methodAMANULLAH AJHARALI·Filed 2007·Granted Mar 19, 2013·2 cites·21 claims
- 1157US7768633B2Multiple surface inspection system and methodASTI HOLDINGS LTD·Filed 2007·Granted Aug 3, 2010·1 cites·20 claims
- 1249US2015233840A1System and method for inspecting a waferAMANULLAH AJHARALI·Filed 2013·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →