Inventor · disambiguated record
Hitoshi Namai
Also filed as: NAMAI HITOSHI
5 granted patents·2 pending applications·12 citations·filing 2006–2022
70Inventor score
Top patents by PatentIndex Score
7 records- 0186US10186399B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2017·Granted Jan 22, 2019·4 cites·10 claims
- 0274US10724856B2Image analysis apparatus and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Jul 28, 2020·2 cites·6 claims
- 0362US8953855B2Edge detection technique and charged particle radiation equipmentNAMAI HITOSHI·Filed 2009·Granted Feb 10, 2015·6 cites·8 claims
- 0453US2023230886A1Processor system, semiconductor inspection system, and programHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 0546US10096451B2Pattern measurement device and computer programHITACHI HIGH TECH CORP·Filed 2014·Granted Oct 9, 2018·0 cites·15 claims
- 0638US9329034B2Pattern determination device and computer programNAMAI HITOSHI·Filed 2011·Granted May 3, 2016·0 cites·20 claims
- 0735US2007103463A1Simulation apparatusBENIYAMA FUMIKO·Filed 2006·Application pending·0 cites
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