Inventor · disambiguated record
Makoto Haseyama
Also filed as: HASEYAMA MAKOTO
26 granted patents·581 citations·filing 1997–2013
97Inventor score
Top patents by PatentIndex Score
26 records- 0193US6661247B2Semiconductor testing deviceFUJITSU LTD·Filed 2001·Granted Dec 9, 2003·41 cites·14 claims
- 0292US6229320B1IC socket, a test method using the same and an IC socket mounting mechanismFUJITSU LTD·Filed 1997·Granted May 8, 2001·82 cites·22 claims
- 0391US6033233AElectrical connecting device, and semiconductor device testing methodFUJITSU LTD·Filed 1998·Granted Mar 7, 2000·82 cites·22 claims
- 0489US7112889B1Semiconductor device having an alignment mark formed by the same material with a metal postFUJITSU LTD·Filed 2000·Granted Sep 26, 2006·36 cites·9 claims
- 0589US6624645B2Semiconductor device testing method, using a spring-biased transformable conductive member electrode connectionFUJITSU LTD·Filed 2000·Granted Sep 23, 2003·40 cites·8 claims
- 0689US6535002B2IC socket, a test method using the same and an IC socket mounting mechanismFUJITSU LTD·Filed 2001·Granted Mar 18, 2003·36 cites·8 claims
- 0784US6466046B1Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactorFUJITSU LTD·Filed 1999·Granted Oct 15, 2002·56 cites·20 claims
- 0880US6249135B1Method and apparatus for passive optical characterization of semiconductor substrates subjected to high energy (MEV) ion implantation using high-injection surface photovoltageFUJITSU LTD·Filed 1999·Granted Jun 19, 2001·34 cites·3 claims
- 0978US6630839B1Contactor, a method of manufacturing the contactor and a device and method of testing electronic component using the contactorFUJITSU LTD·Filed 2000·Granted Oct 7, 2003·19 cites·5 claims
- 1078US6555764B1Integrated circuit contactor, and method and apparatus for production of integrated circuit contactorFUJITSU LTD·Filed 1999·Granted Apr 29, 2003·36 cites·3 claims
- 1174US6781395B2Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactorFUJITSU LTD·Filed 2003·Granted Aug 24, 2004·13 cites·1 claims
- 1271US8759119B2Method of testing a semiconductor device and suctioning a semiconductor device in the wafer stateFUJITSU SEMICONDUCTOR LTD·Filed 2013·Granted Jun 24, 2014·2 cites·4 claims
- 1370US6603325B2Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactorFUJITSU LTD·Filed 2002·Granted Aug 5, 2003·10 cites·5 claims
- 1468US7161370B2Semiconductor testing deviceFUJITSU LTD·Filed 2005·Granted Jan 9, 2007·2 cites·1 claims
- 1567US6046598ATest board and a test method using the same providing improved electrical connectionFUJITSU LTD·Filed 1997·Granted Apr 4, 2000·27 cites·33 claims
- 1665US6445200B2Semiconductor element testing carrier using a membrane contactor and a semiconductor element testing method and apparatus using such a carrierFUJITSU LTD·Filed 1998·Granted Sep 3, 2002·30 cites·16 claims
- 1760US6882169B2Semiconductor testing deviceFUJITSU LTD·Filed 2003·Granted Apr 19, 2005·6 cites·5 claims
- 1854US6975126B2Contactor apparatus for semiconductor devices and a test method of semiconductor devicesFUJITSU LTD·Filed 2003·Granted Dec 13, 2005·3 cites·16 claims
- 1953US8404496B2Method of testing a semiconductor device and suctioning a semiconductor device in the wafer stateMARUYAMA SHIGEYUKI·Filed 2006·Granted Mar 26, 2013·1 cites·2 claims
- 2052US7196530B2Device testing contactor, method of producing the same, and device testing carrierFUJITSU LTD·Filed 2003·Granted Mar 27, 2007·2 cites·1 claims
- 2152US7028398B2Contactor, a method of manufacturing the contactor and a device and method of testing electronic component using the contactorFUJITSU LTD·Filed 2003·Granted Apr 18, 2006·4 cites·3 claims
- 2251US7304487B2Test method of semiconductor devicesFUJITSU LTD·Filed 2005·Granted Dec 4, 2007·0 cites·6 claims
- 2349US6643922B2Device testing contactor, method of producing the same, and device testing carrierFUJITSU LTD·Filed 2002·Granted Nov 11, 2003·1 cites·7 claims
- 2444US6191604B1Integrated circuit testing deviceFUJITSU LTD·Filed 1999·Granted Feb 20, 2001·11 cites·13 claims
- 2543US7174629B2Integrated circuit contactor, and method and apparatus for production of integrated circuit contactorFUJITSU LTD·Filed 2003·Granted Feb 13, 2007·2 cites·19 claims
- 2639US6512386B2Device testing contactor, method of producing the same, and device testing carrierFUJITSU LTD·Filed 1999·Granted Jan 28, 2003·5 cites·11 claims
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