Inventor · disambiguated record
William V. Huott
Also filed as: HUOTT WILLIAM · HUOTT WILLIAM V · HUOTT WILLIAM VINCENT
87 granted patents·14 pending applications·850 citations·filing 1992–2024
99Inventor score
Files withIBM96CADENCE DESIGN SYSTEMS INC1DUFFY KEVIN J1HUOTT WILLIAM V1INTERNAT BUSINES MACHINE CORP1
Top patents by PatentIndex Score
101 records- 0193US6625769B1Method for IC fault analysis using programmable built-in self test and optical emissionIBM·Filed 2000·Granted Sep 23, 2003·98 cites·31 claims
- 0291US7257745B2Array self repair using built-in self test techniquesIBM·Filed 2005·Granted Aug 14, 2007·22 cites·14 claims
- 0389US12174251B2System testing using partitioned and controlled noiseIBM·Filed 2021·Granted Dec 24, 2024·2 cites·20 claims
- 0489US7437626B2Efficient method of test and soft repair of SRAM with redundancyIBM·Filed 2005·Granted Oct 14, 2008·21 cites·3 claims
- 0588US9136019B1Built-in testing of unused element on chipIBM·Filed 2014·Granted Sep 15, 2015·10 cites·9 claims
- 0685US10890623B1Power saving scannable latch output driverIBM·Filed 2019·Granted Jan 12, 2021·2 cites·20 claims
- 0785US7400555B2Built in self test circuit for measuring total timing uncertainty in a digital data pathIBM·Filed 2003·Granted Jul 15, 2008·24 cites·29 claims
- 0884US9548773B1Mitigation of EMI/ESD-caused transmission errors on an electronic circuitIBM·Filed 2016·Granted Jan 17, 2017·5 cites·20 claims
- 0983US5659551AProgrammable computer system element with built-in self test method and apparatus for repair during power-onIBM·Filed 1995·Granted Aug 19, 1997·117 cites·9 claims
- 1080US7793173B2Efficient memory product for test and soft repair of SRAM with redundancyIBM·Filed 2008·Granted Sep 7, 2010·11 cites·3 claims
- 1180US7478297B2Merged MISR and output register without performance impact for circuits under testIBM·Filed 2007·Granted Jan 13, 2009·8 cites·4 claims
- 1279US9627012B1Shift register with opposite shift data and shift clock directionsIBM·Filed 2016·Granted Apr 18, 2017·5 cites·14 claims
- 1379US8055960B2Self test apparatus for identifying partially defective memoryIBM·Filed 2008·Granted Nov 8, 2011·10 cites·6 claims
- 1479US6865501B2Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collectionIBM·Filed 2003·Granted Mar 8, 2005·16 cites·7 claims
- 1579US6671644B2Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collectionIBM·Filed 2001·Granted Dec 30, 2003·15 cites·22 claims
- 1678US6728914B2Random path delay testing methodologyCADENCE DESIGN SYSTEMS INC·Filed 2000·Granted Apr 27, 2004·22 cites·16 claims
- 1778US6662324B1Global transition scan based AC methodIBM·Filed 2000·Granted Dec 9, 2003·22 cites·15 claims
- 1875US7305602B2Merged MISR and output register without performance impact for circuits under testIBM·Filed 2005·Granted Dec 4, 2007·8 cites·19 claims
- 1974US9753076B2Voltage rail monitoring to detect electromigrationIBM·Filed 2016·Granted Sep 5, 2017·1 cites·20 claims
- 2073US9746516B2Collecting diagnostic data from chipsIBM·Filed 2016·Granted Aug 29, 2017·1 cites·4 claims
- 2173US9285423B2Managing chip testing dataIBM·Filed 2013·Granted Mar 15, 2016·2 cites·15 claims
- 2273US7606060B2Eight transistor SRAM cell with improved stability requiring only one word lineIBM·Filed 2007·Granted Oct 20, 2009·7 cites·2 claims
- 2373US7295458B2Eight transistor SRAM cell with improved stability requiring only one word lineIBM·Filed 2006·Granted Nov 13, 2007·7 cites·11 claims
- 2472US7752514B2Methods and apparatus for testing a scan chain to isolate defectsIBM·Filed 2007·Granted Jul 6, 2010·5 cites·8 claims
- 2572US5661732AProgrammable ABIST microprocessor for testing arrays with two logical viewsIBM·Filed 1995·Granted Aug 26, 1997·64 cites·16 claims
- 2671US9041428B2Placement of storage cells on an integrated circuitIBM·Filed 2013·Granted May 26, 2015·3 cites·19 claims
- 2771US7178075B2High-speed level sensitive scan design test scheme with pipelined test clocksIBM·Filed 2005·Granted Feb 13, 2007·6 cites·17 claims
- 2871US6912665B2Automatic timing analyzerIBM·Filed 2001·Granted Jun 28, 2005·17 cites·15 claims
- 2970US9697910B1Multi-match error detection in content addressable memory testingIBM·Filed 2016·Granted Jul 4, 2017·3 cites·18 claims
- 3069US10971242B2Sequential error capture during memory testIBM·Filed 2019·Granted Apr 6, 2021·2 cites·11 claims
- 3169US7219275B2Method and apparatus for providing flexible modular redundancy allocation for memory built in self test of SRAM with redundancyIBM·Filed 2005·Granted May 15, 2007·7 cites·16 claims
- 3268US10998075B2Built-in self-test for bit-write enabled memory arraysIBM·Filed 2019·Granted May 4, 2021·2 cites·20 claims
- 3368US7129764B2System and method for local generation of a ratio clockIBM·Filed 2005·Granted Oct 31, 2006·4 cites·20 claims
- 3468US6125465AIsolation/removal of faults during LBIST testingIBM·Filed 1998·Granted Sep 26, 2000·29 cites·2 claims
- 3568US5420467AProgrammable delay clock chopper/stretcher with fast recoveryIBM·Filed 1992·Granted May 30, 1995·21 cites·17 claims
- 3667US11817697B2Method to limit the time a semiconductor device operates above a maximum operating voltageIBM·Filed 2022·Granted Nov 14, 2023·0 cites·25 claims
- 3767US7434130B2Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collectionIBM·Filed 2004·Granted Oct 7, 2008·8 cites·3 claims
- 3867US7313744B2Methods and apparatus for testing a scan chain to isolate defectsIBM·Filed 2004·Granted Dec 25, 2007·10 cites·30 claims
- 3966US9372232B2Collecting diagnostic data from chipsIBM·Filed 2013·Granted Jun 21, 2016·1 cites·4 claims
- 4066US9043683B2Error protection for integrated circuitsIBM·Filed 2013·Granted May 26, 2015·3 cites·15 claims
- 4166US7139944B2Method and system for determining minimum post production test time required on an integrated circuit device to achieve optimum reliabilityIBM·Filed 2003·Granted Nov 21, 2006·15 cites·21 claims
- 4266US5805789AProgrammable computer system element with built-in self test method and apparatus for repair during power-onIBM·Filed 1997·Granted Sep 8, 1998·49 cites·5 claims
- 4365US5633877AProgrammable built-in self test method and controller for arraysIBM·Filed 1995·Granted May 27, 1997·52 cites·18 claims
- 4464US8117579B2LSSD compatibility for GSD unified global clock buffersWARNOCK JAMES DOUGLAS·Filed 2008·Granted Feb 14, 2012·6 cites·13 claims
- 4563US10163493B2SRAM margin recovery during burn-inIBM·Filed 2017·Granted Dec 25, 2018·1 cites·11 claims
- 4663US9355746B2Built-in testing of unused element on chipIBM·Filed 2014·Granted May 31, 2016·2 cites·14 claims
- 4763US6836865B2Method and apparatus for facilitating random pattern testing of logic structuresIBM·Filed 2001·Granted Dec 28, 2004·11 cites·19 claims
- 4862US2018074109A1Voltage Rail Monitoring to Detect ElectromigrationIBM·Filed 2017·Application pending·0 cites
- 4960US6314540B1Partitioned pseudo-random logic test for improved manufacturability of semiconductor chipsIBM·Filed 1999·Granted Nov 6, 2001·24 cites·18 claims
- 5060US2025328177A1Two-stage processor voltage regulationIBM·Filed 2024·Application pending·0 cites
Showing the top 50 of 101 patent records by PatentIndex Score.
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