Inventor · disambiguated record
Dhananjay Raghavan
Also filed as: RAGHAVAN DHANANJAY · RAGHAVAN DHANANJAY SRINIVASA
4 granted patents·33 citations·filing 2005–2022
73Inventor score
Technology areasG01R
Top patents by PatentIndex Score
4 records- 0186US7301836B1Feature control circuitry for testing integrated circuitsALTERA CORP·Filed 2005·Granted Nov 27, 2007·18 cites·20 claims
- 0285US11609262B2On-die aging measurements for dynamic timing modelingINTEL CORP·Filed 2018·Granted Mar 21, 2023·2 cites·20 claims
- 0378US12216150B2On-die aging measurements for dynamic timing modelingINTEL CORP·Filed 2022·Granted Feb 4, 2025·0 cites·20 claims
- 0473US8531196B1Delay test circuitrySHELAT JAYDEV AMIT·Filed 2009·Granted Sep 10, 2013·13 cites·19 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →