Inventor · disambiguated record
Adin E. Hyslop
Also filed as: HYSLOP ADIN · HYSLOP ADIN E
15 granted patents·559 citations·filing 1984–2005
95Inventor score
Top patents by PatentIndex Score
15 records- 0195US6373127B1Integrated capacitor on the back of a chipTEXAS INSTRUMENTS INC·Filed 1999·Granted Apr 16, 2002·229 cites·10 claims
- 0282US6418070B1Memory device tester and method for testing reduced power statesMICRON TECHNOLOGY INC·Filed 1999·Granted Jul 9, 2002·36 cites·22 claims
- 0377US5321510ASerial video processorTEXAS INSTRUMENTS INC·Filed 1992·Granted Jun 14, 1994·58 cites·42 claims
- 0477US4627033ASense amplifier with reduced instantaneous powerTEXAS INSTRUMENTS INC·Filed 1984·Granted Dec 2, 1986·25 cites·13 claims
- 0576US4608670ACMOS sense amplifier with N-channel sensingTEXAS INSTRUMENTS INC·Filed 1984·Granted Aug 26, 1986·24 cites·15 claims
- 0675US5309446ATest validation method for a semiconductor memory deviceTEXAS INSTRUMENTS INC·Filed 1992·Granted May 3, 1994·40 cites·7 claims
- 0774US5343433ACMOS sense amplifierTEXAS INSTRUMENTS INC·Filed 1990·Granted Aug 30, 1994·36 cites·12 claims
- 0873US4547868ADummy-cell circuitry for dynamic read/write memoryTEXAS INSTRUMENTS INC·Filed 1984·Granted Oct 15, 1985·21 cites·11 claims
- 0972US5127739ACMOS sense amplifier with bit line isolationTEXAS INSTRUMENTS INC·Filed 1990·Granted Jul 7, 1992·34 cites·2 claims
- 1068US5793694ASemiconductor integrated circuit device having means for peak current reductionHITACHI LTD·Filed 1996·Granted Aug 11, 1998·29 cites·8 claims
- 1166US6775192B2Memory device tester and method for testing reduced power statesMICRON TECHNOLOGY INC·Filed 2002·Granted Aug 10, 2004·10 cites·36 claims
- 1266US6674677B2Memory device tester and method for testing reduced power statesMICRON TECHNOLOGY INC·Filed 2002·Granted Jan 6, 2004·10 cites·30 claims
- 1357US7161866B2Memory device tester and method for testing reduced power statesMICRON TECHNOLOGY INC·Filed 2005·Granted Jan 9, 2007·2 cites·35 claims
- 1443US6914843B2Memory device tester and method for testing reduced power statesMICRON TECHNOLOGY INC·Filed 2002·Granted Jul 5, 2005·2 cites·33 claims
- 1527US6028800ASense amplifier driver having variable power-supply voltageHITACHI LTD OF JAPAN·Filed 1996·Granted Feb 22, 2000·3 cites·16 claims
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