Inventor · disambiguated record
Wagdi W. Abadeer
Also filed as: ABADEER WAGDI · ABADEER WAGDI W · ABADEER WAGDI WILLIAM
80 granted patents·17 pending applications·1,606 citations·filing 1991–2013
99Inventor score
Top patents by PatentIndex Score
97 records- 0199US7790524B2Device and design structures for memory cells in a non-volatile random access memory and methods of fabricating such device structuresIBM·Filed 2008·Granted Sep 7, 2010·248 cites·16 claims
- 0297US7790543B2Device structures for a metal-oxide-semiconductor field effect transistor and methods of fabricating such device structuresIBM·Filed 2008·Granted Sep 7, 2010·80 cites·9 claims
- 0397US7763531B2Method and structure to process thick and thin fins and variable fin to fin spacingIBM·Filed 2007·Granted Jul 27, 2010·73 cites·19 claims
- 0497US7301210B2Method and structure to process thick and thin fins and variable fin to fin spacingIBM·Filed 2006·Granted Nov 27, 2007·65 cites·8 claims
- 0597US7163851B2Concurrent Fin-FET and thick-body device fabricationIBM·Filed 2002·Granted Jan 16, 2007·111 cites·22 claims
- 0696US6876035B2High voltage N-LDMOS transistors having shallow trench isolation regionIBM·Filed 2003·Granted Apr 5, 2005·86 cites·12 claims
- 0795US8021950B1Semiconductor wafer processing method that allows device regions to be selectively annealed following back end of the line (BEOL) metal wiring layer formationIBM·Filed 2010·Granted Sep 20, 2011·20 cites·20 claims
- 0895US6731179B2System and method for measuring circuit performance degradation due to PFET negative bias temperature instability (NBTI)IBM·Filed 2002·Granted May 4, 2004·96 cites·20 claims
- 0995US5334880ALow voltage programmable storage elementIBM·Filed 1991·Granted Aug 2, 1994·124 cites·19 claims
- 1094US7358823B2Programmable capacitors and methods of using the sameIBM·Filed 2006·Granted Apr 15, 2008·20 cites·5 claims
- 1192US6624031B2Test structure and methodology for semiconductor stress-induced defects and antifuse based on same test structureIBM·Filed 2001·Granted Sep 23, 2003·62 cites·13 claims
- 1291US7904658B2Structure for power-efficient cache memoryIBM·Filed 2007·Granted Mar 8, 2011·27 cites·21 claims
- 1391US7087499B2Integrated antifuse structure for FINFET and CMOS devicesIBM·Filed 2002·Granted Aug 8, 2006·58 cites·17 claims
- 1490US7297582B2Method of forming high voltage N-LDMOS transistors having shallow trench isolation region with drain extensionsIBM·Filed 2004·Granted Nov 20, 2007·36 cites·14 claims
- 1588US8216909B2Field effect transistor with air gap dielectricABADEER WAGDI W·Filed 2009·Granted Jul 10, 2012·14 cites·5 claims
- 1688US7872310B2Semiconductor structure and system for fabricating an integrated circuit chipIBM·Filed 2009·Granted Jan 18, 2011·11 cites·6 claims
- 1787US5418738ALow voltage programmable storage elementIBM·Filed 1994·Granted May 23, 1995·53 cites·1 claims
- 1886US6879021B1Electronically programmable antifuse and circuits made therewithIBM·Filed 2003·Granted Apr 12, 2005·43 cites·24 claims
- 1985US8349697B2Field effect transistor with air gap dielectricIBM·Filed 2012·Granted Jan 8, 2013·6 cites·5 claims
- 2083US7466171B2Voltage detection circuit and circuit for generating a trigger flag signalIBM·Filed 2007·Granted Dec 16, 2008·10 cites·20 claims
- 2183US6714113B1Inductor for integrated circuitsIBM·Filed 2000·Granted Mar 30, 2004·43 cites·11 claims
- 2283US6049213AMethod and system for testing the reliability of gate dielectric filmsIBM·Filed 1998·Granted Apr 11, 2000·51 cites·35 claims
- 2382US8413094B2Structure, design structure and process for increasing magnitude of device threshold voltage for low power applicationsKAMAL LILIAN·Filed 2010·Granted Apr 2, 2013·9 cites·23 claims
- 2479US8110483B2Forming an extremely thin semiconductor-on-insulator (ETSOI) layerABADEER WAGDI W·Filed 2009·Granted Feb 7, 2012·7 cites·8 claims
- 2579US7791010B2CMOS image sensor having a third FET device with the gate terminal coupled to the diffusion region of a first FET device, the second terminal coupled to a column signal line, and the first terminal coupled to a row select signalIBM·Filed 2008·Granted Sep 7, 2010·5 cites·40 claims
- 2679US7375339B2Monitoring ionizing radiation in silicon-on insulator integrated circuitsIBM·Filed 2006·Granted May 20, 2008·8 cites·5 claims
- 2777US7939395B2High-voltage SOI MOS device structure and method of fabricationIBM·Filed 2009·Granted May 10, 2011·6 cites·20 claims
- 2876US7825469B2Threshold voltage compensation for pixel design of CMOS image sensorsIBM·Filed 2007·Granted Nov 2, 2010·4 cites·4 claims
- 2976US7061308B2Voltage divider for integrated circuitsIBM·Filed 2003·Granted Jun 13, 2006·20 cites·2 claims
- 3074US7573300B2Current control mechanism for dynamic logic keeper circuits in an integrated circuit and method of regulating sameIBM·Filed 2007·Granted Aug 11, 2009·7 cites·2 claims
- 3172US7473904B2Device for monitoring ionizing radiation in silicon-on insulator integrated circuitsIBM·Filed 2008·Granted Jan 6, 2009·5 cites·15 claims
- 3271US8562210B2Thermal sensor for semiconductor circuitsCHRISTIANSEN CATHRYN J·Filed 2010·Granted Oct 22, 2013·4 cites·14 claims
- 3370US7687883B2Electronically programmable antifuse and circuits made therewithIBM·Filed 2007·Granted Mar 30, 2010·3 cites·6 claims
- 3470US7498869B2Voltage reference circuit for low voltage applications in an integrated circuitIBM·Filed 2007·Granted Mar 3, 2009·7 cites·12 claims
- 3569US7692130B2CMOS imaging sensor having a third FET device with a gate terminal coupled to a second diffusion region of a first FET device and a first terminal coupled to a row select signalIBM·Filed 2006·Granted Apr 6, 2010·2 cites·39 claims
- 3669US6730552B1MOSFET with decoupled halo before extensionIBM·Filed 2003·Granted May 4, 2004·14 cites·9 claims
- 3767US7471114B2Design structure for a current control mechanism for power networks and dynamic logic keeper circuitsIBM·Filed 2007·Granted Dec 30, 2008·5 cites·17 claims
- 3866US7873921B2Structure for a voltage detection circuit in an integrated circuit and method of generating a trigger flag signalIBM·Filed 2007·Granted Jan 18, 2011·3 cites·5 claims
- 3966US7709926B2Device structures for active devices fabricated using a semiconductor-on-insulator substrate and design structures for a radiofrequency integrated circuitIBM·Filed 2008·Granted May 4, 2010·3 cites·13 claims
- 4066US7477541B2Memory elements and methods of using the sameIBM·Filed 2006·Granted Jan 13, 2009·5 cites·11 claims
- 4166US7132325B2Test structure and methodology for semiconductor stress-induced defects and antifuse based on same test structureIBM·Filed 2003·Granted Nov 7, 2006·10 cites·19 claims
- 4266US6278339B2Termination resistance independent system for impedance matching in high speed input-output chip interfacingIBM·Filed 2000·Granted Aug 21, 2001·9 cites·18 claims
- 4365US7939911B2Back-end-of-line resistive semiconductor structuresIBM·Filed 2008·Granted May 10, 2011·2 cites·20 claims
- 4464US6982591B2Method and circuit for compensating for tunneling currentIBM·Filed 2003·Granted Jan 3, 2006·15 cites·17 claims
- 4564US5929667AMethod and apparatus for protecting circuits subjected to high voltageIBM·Filed 1997·Granted Jul 27, 1999·19 cites·15 claims
- 4663US7326987B2Non-continuous encapsulation layer for MIM capacitorIBM·Filed 2005·Granted Feb 5, 2008·2 cites·14 claims
- 4760US7659497B2On demand circuit function execution employing optical sensingIBM·Filed 2005·Granted Feb 9, 2010·1 cites·15 claims
- 4860US7622946B2Design structure for an automatic driver/transmission line/receiver impedance matching circuitryIBM·Filed 2007·Granted Nov 24, 2009·3 cites·5 claims
- 4960US7215002B2Electronically programmable antifuse and circuits made therewithIBM·Filed 2005·Granted May 8, 2007·1 cites·6 claims
- 5059US7977201B2Methods for forming back-end-of-line resistive semiconductor structuresIBM·Filed 2008·Granted Jul 12, 2011·1 cites·25 claims
Showing the top 50 of 97 patent records by PatentIndex Score.
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