Inventor · disambiguated record
Yang-Hyong Kim
Also filed as: KIM YANG-HYONG
3 granted patents·30 citations·filing 1999–2001
66Inventor score
Files withSAMSUNG ELECTRONICS CO LTD3
Top patents by PatentIndex Score
3 records- 0161US6545491B2Apparatus for detecting defects in semiconductor devices and methods of using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Apr 8, 2003·11 cites·31 claims
- 0250US6525318B1Methods of inspecting integrated circuit substrates using electron beamsSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Feb 25, 2003·19 cites·20 claims
- 0322US6100102AMethod of in-line monitoring for shallow pit on semiconductor substrateSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Aug 8, 2000·0 cites·16 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →