Inventor · disambiguated record
Kazuhito Hayasaka
Also filed as: HAYASAKA KAZUHITO
4 granted patents·2 pending applications·4 citations·filing 2009–2023
60Inventor score
Top patents by PatentIndex Score
6 records- 0186US11385284B2Test system and test methodKIOXIA CORP·Filed 2020·Granted Jul 12, 2022·3 cites·15 claims
- 0257US12469729B2Storage systemKIOXIA CORP·Filed 2023·Granted Nov 11, 2025·0 cites·20 claims
- 0357US2024014061A1Cassette housing, prober, server rack, and storage systemKIOXIA CORP·Filed 2023·Application pending·0 cites
- 0456US2023324455A1Wafer and proberKIOXIA CORP·Filed 2023·Application pending·0 cites
- 0549US10838033B2Tester calibration device and tester calibration methodTOSHIBA MEMORY CORP·Filed 2018·Granted Nov 17, 2020·0 cites·18 claims
- 0637US8421492B2Probe card and method for selecting the sameHAYASAKA KAZUHITO·Filed 2009·Granted Apr 16, 2013·1 cites·9 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →