Inventor · disambiguated record
Il-Suk Park
Also filed as: PARK IL-SUK
2 granted patents·1 pending application·2 citations·filing 2015–2024
35Inventor score
Files withSAMSUNG ELECTRONICS CO LTD3
Top patents by PatentIndex Score
3 records- 0169US9727799B2Method of automatic defect classificationSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Aug 8, 2017·2 cites·20 claims
- 0250US2025217966A1Image processing device and image processing methodSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0335US9831137B2Defect imaging apparatus, defect detection system having the same, and method of detecting defects using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Nov 28, 2017·0 cites·20 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →