Inventor · disambiguated record
Hans-Christoph Ostendorf
Also filed as: OSTENDORF HANS-CHRISTOPH
3 granted patents·1 pending application·15 citations·filing 2002–2006
62Inventor score
Top patents by PatentIndex Score
4 records- 0160US6897646B2Method for testing wafers to be tested and calibration apparatusINFINEON TECHNOLOGIES AG·Filed 2002·Granted May 24, 2005·11 cites·10 claims
- 0241US7206985B2Method and apparatus for calibrating a test system for an integrated semiconductor circuitINFINEON TECHNOLOGIES AG·Filed 2002·Granted Apr 17, 2007·4 cites·12 claims
- 0328US7574643B2Test apparatus and method for testing a circuit unitINFINEON TECHNOLOGIES AG·Filed 2006·Granted Aug 11, 2009·0 cites·8 claims
- 0422US2006120199A1Electronic circuitOHLHOFF CARSTEN·Filed 2005·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →