Inventor · disambiguated record
Michael P. Tenney
Also filed as: TENNEY MICHAEL · TENNEY MICHAEL P
20 granted patents·100 citations·filing 2001–2014
94Inventor score
Top patents by PatentIndex Score
20 records- 0188US7205237B2Apparatus and method for selected site backside unlayering of si, GaAs, GaxAlyAszof SOI technologies for scanning probe microscopy and atomic force probing characterizationIBM·Filed 2005·Granted Apr 17, 2007·15 cites·20 claims
- 0283US9170273B2High frequency capacitance-voltage nanoprobing characterizationIBM·Filed 2013·Granted Oct 27, 2015·6 cites·17 claims
- 0377US8701511B2Inert gas delivery system for electrical inspection apparatusOLDREY RICHARD WALTER·Filed 2011·Granted Apr 22, 2014·4 cites·10 claims
- 0477US7993504B2Backside unlayering of MOSFET devices for electrical and physical characterizationIBM·Filed 2008·Granted Aug 9, 2011·3 cites·20 claims
- 0576US7371689B2Backside unlayering of MOSFET devices for electrical and physical characterizationIBM·Filed 2005·Granted May 13, 2008·3 cites·14 claims
- 0671US8125048B2Antifuse structure for in line circuit modificationKANE TERENCE L·Filed 2009·Granted Feb 28, 2012·3 cites·4 claims
- 0771US6670717B2Structure and method for charge sensitive electrical devicesIBM·Filed 2001·Granted Dec 30, 2003·13 cites·21 claims
- 0871US6630395B1Methods for fabricating electrical connections to semiconductor structures incorporating low-k dielectric materialsIBM·Filed 2002·Granted Oct 7, 2003·15 cites·14 claims
- 0970US6858530B2Method for electrically characterizing charge sensitive semiconductor devicesIBM·Filed 2003·Granted Feb 22, 2005·12 cites·10 claims
- 1068US8367484B2Antifuse structure for in line circuit modificationIBM·Filed 2012·Granted Feb 5, 2013·1 cites·5 claims
- 1167US6884641B2Site-specific methodology for localization and analyzing junction defects in mosfet devicesIBM·Filed 2003·Granted Apr 26, 2005·11 cites·20 claims
- 1259US7881093B2Programmable precision resistor and method of programming the sameIBM·Filed 2008·Granted Feb 1, 2011·1 cites·10 claims
- 1357US9052338B2Inert gas delivery system for electrical inspection apparatusIBM·Filed 2013·Granted Jun 9, 2015·0 cites·3 claims
- 1456US6703641B2Structure for detecting charging effects in device processingIBM·Filed 2001·Granted Mar 9, 2004·6 cites·9 claims
- 1555US6888224B1Methods and systems for fabricating electrical connections to semiconductor structures incorporating low-k dielectric materialsIBM·Filed 2003·Granted May 3, 2005·5 cites·4 claims
- 1654US8368070B2Antifuse structure for in line circuit modificationIBM·Filed 2012·Granted Feb 5, 2013·0 cites·8 claims
- 1754US8368069B2Antifuse structure for in line circuit modificationIBM·Filed 2012·Granted Feb 5, 2013·0 cites·2 claims
- 1854US8367483B2Antifuse structure for in line circuit modificationIBM·Filed 2012·Granted Feb 5, 2013·0 cites·2 claims
- 1944US7015146B2Method of processing backside unlayering of MOSFET devices for electrical and physical characterization including a collimated ion plasmaIBM·Filed 2004·Granted Mar 21, 2006·0 cites·15 claims
- 2043US9624710B2Door operating systemDOOR ENG AND MFG LLC·Filed 2014·Granted Apr 18, 2017·2 cites·21 claims
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