Inventor · disambiguated record
Frederic Dupont
Also filed as: DUPONT FREDERIC · DUPONT FRÉDÉRIC · DUPONT FRÉDÉRIC GEORGES MICHEL
13 granted patents·138 citations·filing 2001–2013
90Inventor score
Top patents by PatentIndex Score
13 records- 0193US7531428B2Recycling the reconditioned substrates for fabricating compound material wafersSOITEC SILICON ON INSULATOR·Filed 2005·Granted May 12, 2009·30 cites·19 claims
- 0287US6808629B2Method for effluent purificationDEGREMONT·Filed 2001·Granted Oct 26, 2004·70 cites·14 claims
- 0385US7452745B2Photodetecting deviceSOITEC SILICON ON INSULATOR·Filed 2006·Granted Nov 18, 2008·8 cites·25 claims
- 0485US7232743B2Semiconductor structure for providing strained crystalline layer on insulator and method for fabricating sameSOITEC SILICON ON INSULATOR·Filed 2005·Granted Jun 19, 2007·9 cites·25 claims
- 0579US7695996B2Photodetecting deviceSOITEC SILICON ON INSULATOR·Filed 2008·Granted Apr 13, 2010·4 cites·20 claims
- 0669US7851330B2Methods for fabricating compound material wafersSOITEC SILICON ON INSULATOR·Filed 2009·Granted Dec 14, 2010·3 cites·12 claims
- 0767US6995427B2Semiconductor structure for providing strained crystalline layer on insulator and method for fabricating sameSOITEC SILICON ON INSULATOR·Filed 2004·Granted Feb 7, 2006·9 cites·31 claims
- 0864US7968909B2Reconditioned substrates for fabricating compound material wafersSOITEC SILICON ON INSULATOR·Filed 2010·Granted Jun 28, 2011·1 cites·15 claims
- 0962US8878160B2III-V light emitting device with thin n-type regionKONINKL PHILIPS NV·Filed 2013·Granted Nov 4, 2014·0 cites·8 claims
- 1059US9011598B2Method for making a composite substrate and composite substrate according to the methodBOUSSAGOL ALICE·Filed 2006·Granted Apr 21, 2015·3 cites·9 claims
- 1155US8581229B2III-V light emitting device with thin n-type regionDUPONT FREDERIC·Filed 2009·Granted Nov 12, 2013·1 cites·13 claims
- 1236US8785293B2Adaptation of the lattice parameter of a layer of strained materialGUENARD PASCAL·Filed 2010·Granted Jul 22, 2014·0 cites·15 claims
- 1323US8310266B2Device for characterizing the electro-optical performance of a semiconductor componentDAULTIER YVES·Filed 2010·Granted Nov 13, 2012·0 cites·5 claims
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