Inventor · disambiguated record
Kinga Kornilov
Also filed as: KORNILOV KINGA
6 granted patents·1 pending application·4 citations·filing 2017–2024
72Inventor score
Files withZEISS CARL SMT GMBH7
Top patents by PatentIndex Score
7 records- 0185US11237187B2Method and apparatus for examining a measuring tip of a scanning probe microscopeZEISS CARL SMT GMBH·Filed 2020·Granted Feb 1, 2022·2 cites·21 claims
- 0277US10372032B2Method and device for permanently repairing defects of absent material of a photolithographic maskZEISS CARL SMT GMBH·Filed 2017·Granted Aug 6, 2019·2 cites·19 claims
- 0376US2024272198A1Methods and devices for extending a time period until changing a measuring tip of a scanning probe microscopeZEISS CARL SMT GMBH·Filed 2024·Application pending·0 cites
- 0472US11977097B2Methods and devices for extending a time period until changing a measuring tip of a scanning probe microscopeZEISS CARL SMT GMBH·Filed 2022·Granted May 7, 2024·0 cites·31 claims
- 0569US11353478B2Methods and devices for extending a time period until changing a measuring tip of a scanning probe microscopeZEISS CARL SMT GMBH·Filed 2019·Granted Jun 7, 2022·0 cites·28 claims
- 0668US11680963B2Method and apparatus for examining a measuring tip of a scanning probe microscopeZEISS CARL SMT GMBH·Filed 2021·Granted Jun 20, 2023·0 cites·21 claims
- 0752US10732501B2Method and device for permanently repairing defects of absent material of a photolithographic maskZEISS CARL SMT GMBH·Filed 2019·Granted Aug 4, 2020·0 cites·24 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →