Inventor · disambiguated record
Katsumi Otani
Also filed as: OTANI KATSUMI
9 granted patents·3 pending applications·59 citations·filing 1987–2025
85Inventor score
Top patents by PatentIndex Score
12 records- 0181US7989947B2Semiconductor device and method of manufacturing the samePANASONIC CORP·Filed 2008·Granted Aug 2, 2011·12 cites·20 claims
- 0278US9687871B2Process for manufacturing elastic roller, and coating apparatusCANON KK·Filed 2015·Granted Jun 27, 2017·2 cites·3 claims
- 0374US2025183126A1Semiconductor device and method for manufacturing the samePANASONIC IP MAN CO LTD·Filed 2025·Application pending·0 cites
- 0472US8711561B2Cooling structure for electronic deviceMATSUMOTO SUBARU·Filed 2012·Granted Apr 29, 2014·4 cites·8 claims
- 0569US7010378B2Component and material traceability control apparatus, control method, control program, and control program memory mediumHITACHI LTD·Filed 2005·Granted Mar 7, 2006·9 cites·16 claims
- 0668US12255127B2Semiconductor device and method for manufacturing the samePANASONIC IP MAN CO LTD·Filed 2021·Granted Mar 18, 2025·0 cites·27 claims
- 0764US4788680AMethod of selecting time slot in time division switching network and apparatus thereforHITACHI LTD·Filed 1987·Granted Nov 29, 1988·29 cites·10 claims
- 0862US9219021B2Semiconductor device including heat dissipating structurePANASONIC CORP·Filed 2014·Granted Dec 22, 2015·2 cites·20 claims
- 0961US2025079370A1Semiconductor deviceNUVOTON TECHNOLOGY CORP JAPAN·Filed 2024·Application pending·0 cites
- 1059US11189549B2Semiconductor device and method for manufacturing the samePANASONIC IP MAN CO LTD·Filed 2019·Granted Nov 30, 2021·0 cites·17 claims
- 1157US7200457B2Component and material traceability control apparatus, control method, control program, and control program memory mediumHITACHI LTD·Filed 2005·Granted Apr 3, 2007·1 cites·4 claims
- 1237US2011079902A1Semiconductor deviceSAKAMOTO TAKESHI·Filed 2010·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →