Inventor · disambiguated record
Shigeki Takizawa
Also filed as: TAKIZAWA SHIGEKI
5 granted patents·51 citations·filing 1998–2009
77Inventor score
Technology areasG01R
Files withADVANTEST CORP5
Top patents by PatentIndex Score
5 records- 0173US6275057B1Semiconductor test system having high frequency and low jitter clock generatorADVANTEST CORP·Filed 1998·Granted Aug 14, 2001·40 cites·13 claims
- 0257US7802160B2Test apparatus and calibration methodADVANTEST CORP·Filed 2007·Granted Sep 21, 2010·3 cites·20 claims
- 0355US7876118B2Test equipmentADVANTEST CORP·Filed 2009·Granted Jan 25, 2011·2 cites·6 claims
- 0453US7768255B2Interconnection substrate, skew measurement method, and test apparatusADVANTEST CORP·Filed 2008·Granted Aug 3, 2010·2 cites·9 claims
- 0545US7350123B2Test apparatus, correction value managing method, and computer programADVANTEST CORP·Filed 2004·Granted Mar 25, 2008·4 cites·13 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →