Inventor · disambiguated record
Nariaki Fujiwara
Also filed as: FUJIWARA NARIAKI
8 granted patents·2 pending applications·291 citations·filing 1989–2012
89Inventor score
Top patents by PatentIndex Score
10 records- 0190US5493401AMethod of measuring film thicknessesDAINIPPON SCREEN MFG·Filed 1994·Granted Feb 20, 1996·80 cites·4 claims
- 0287US5136149AMethod of focusing optical head on object body and automatic focusing device for optical inspection system including tilt detectionDAINIPPON SCREEN MFG·Filed 1991·Granted Aug 4, 1992·62 cites·17 claims
- 0383US6000996AGrinding process monitoring system and grinding process monitoring methodDAINIPPON SCREEN MFG·Filed 1998·Granted Dec 14, 1999·62 cites·11 claims
- 0459US5422703AReflected light measuring method and reflected light measuring apparatus for a microscopic photometric systemDAINIPPON SCREEN MFG·Filed 1994·Granted Jun 6, 1995·19 cites·11 claims
- 0558US5251011ADisplacement detection systemDAINIPPON SCREEN MFG·Filed 1992·Granted Oct 5, 1993·28 cites·34 claims
- 0654US5048960AMicrospectroscopeDAINIPPON SCREEN MFG·Filed 1989·Granted Sep 17, 1991·16 cites·6 claims
- 0753US5715061AOptical measuring apparatus and optical measuring methodDAINIPPON SCREEN MFG·Filed 1996·Granted Feb 3, 1998·19 cites·27 claims
- 0850US7012702B2Measuring apparatusDAINIPPON SCREEN MFG·Filed 2003·Granted Mar 14, 2006·5 cites·13 claims
- 0943US2012307041A1Image acquisition apparatus, pattern inspection apparatus, and image acquisition methodFUJIWARA NARIAKI·Filed 2012·Application pending·0 cites
- 1039US2006023936A1Film detection apparatus for detecting organic film formed on printed circuit board, inspection system, and method of inspecting printed circuit boardDAINIPPON SCREEN MFG·Filed 2005·Application pending·0 cites
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