Inventor · disambiguated record
Youngnam Kwon
Also filed as: KWON YOUNGNAM
7 granted patents·5 pending applications·4 citations·filing 2004–2025
72Inventor score
Files withSAMSUNG ELECTRONICS CO LTD11
Top patents by PatentIndex Score
12 records- 0189US10950823B2Light emitting device and display apparatus including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Mar 16, 2021·4 cites·25 claims
- 0268US2025383566A1Compound, polymer, electrochromic device, and electronic deviceSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0364US11563199B2Light emitting device and display apparatus including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Jan 24, 2023·0 cites·20 claims
- 0458US11508929B2Conductor and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Nov 22, 2022·0 cites·10 claims
- 0556US11316232B2Composite separator, method of preparing the same, and secondary battery including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Apr 26, 2022·0 cites·20 claims
- 0656US2023357616A1Composite abrasive, method of preparing same, polishing slurry including same, and method of manufacturing semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0755US11211432B2Light emitting device and display apparatus including the light emitting deviceSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Dec 28, 2021·0 cites·35 claims
- 0850US11763989B2Dielectric monolayer thin film, capacitor and semiconductor device each including the same, and method of forming the dielectric monolayer thin filmSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Sep 19, 2023·0 cites·22 claims
- 0947US9985229B2Dielectric and dielectric ink and capacitor and transistor and deviceSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted May 29, 2018·0 cites·17 claims
- 1043US2005112651A1Microarray comprising a substrate having two-dimensional grating and method of detecting target molecule by using the sameFiled 2004·Application pending·0 cites
- 1142US2016226012A1Conductor and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2015·Application pending·0 cites
- 1230US2016169938A1Method of analyzing surface of sample using scanning probe microscope and scanning probe microscope thereforSAMSUNG ELECTRONICS CO LTD·Filed 2015·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →