Inventor · disambiguated record
Sangjune Park
Also filed as: PARK SANGJUNE
4 granted patents·1 pending application·10 citations·filing 2002–2010
64Inventor score
Top patents by PatentIndex Score
5 records- 0160US7183791B2Reliability circuit for applying an AC stress signal or DC measurement to a transistor deviceLSI LOGIC CORP·Filed 2004·Granted Feb 27, 2007·8 cites·19 claims
- 0256US7288947B2Method for simulating resistor characteristics at high electric fieldsLSI CORP·Filed 2005·Granted Oct 30, 2007·2 cites·6 claims
- 0339US6871333B2Bent gate transistor modelingLSI LOGIC CORP·Filed 2002·Granted Mar 22, 2005·0 cites·20 claims
- 0434US2004073412A1Negative bias temperature instability effect modelingFiled 2002·Application pending·0 cites
- 0530US8222745B2Integrated heat sinkPARK SANGJUNE·Filed 2010·Granted Jul 17, 2012·0 cites·20 claims
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