Inventor · disambiguated record
Bozidar Janko
Also filed as: JANKO BOZIDAR
27 granted patents·3 pending applications·807 citations·filing 1976–2003
97Inventor score
Files withTEKTRONIX INC27
Top patents by PatentIndex Score
30 records- 0197US4110749ATouch display to digital encoding systemTEKTRONIX INC·Filed 1977·Granted Aug 29, 1978·120 cites·4 claims
- 0286US4891585AMultiple lead probe for integrated circuits in wafer formTEKTRONIX INC·Filed 1986·Granted Jan 2, 1990·78 cites·9 claims
- 0384US5015946AHigh density probeTEKTRONIX INC·Filed 1990·Granted May 14, 1991·54 cites·3 claims
- 0483US5221895AProbe with microstrip transmission linesTEKTRONIX INC·Filed 1991·Granted Jun 22, 1993·52 cites·27 claims
- 0581US5940124AAttentional maps in objective measurement of video quality degradationTEKTRONIX INC·Filed 1997·Granted Aug 17, 1999·68 cites·6 claims
- 0679US7061920B2Streaming media quality analyzer systemTEKTRONIX INC·Filed 2001·Granted Jun 13, 2006·31 cites·15 claims
- 0779US6795580B1Picture quality measurement using blockinessTEKTRONIX INC·Filed 1998·Granted Sep 21, 2004·62 cites·10 claims
- 0879US5818520AProgrammable instrument for automatic measurement of compressed video qualityTEKTRONIX INC·Filed 1996·Granted Oct 6, 1998·75 cites·9 claims
- 0978US6633329B2Frozen field detection of formerly encoded videoTEKTRONIX INC·Filed 2001·Granted Oct 14, 2003·16 cites·15 claims
- 1078US4075533AElectron beam forming structure utilizing an ion trapTEKTRONIX INC·Filed 1976·Granted Feb 21, 1978·16 cites·5 claims
- 1177US4207492ASlow-wave high frequency deflection structureTEKTRONIX INC·Filed 1978·Granted Jun 10, 1980·17 cites·11 claims
- 1271US6690840B1Image alignment with global translation and linear stretchTEKTRONIX INC·Filed 2000·Granted Feb 10, 2004·16 cites·4 claims
- 1368US4188563ACathode ray tube having an electron lens system including a meshless scan expansion post deflection acceleration lensTEKTRONIX INC·Filed 1978·Granted Feb 12, 1980·9 cites·9 claims
- 1464US4137479ACathode ray tube having an electron lens system including a meshless scan expansion post deflection acceleration lensTEKTRONIX INC·Filed 1977·Granted Jan 30, 1979·8 cites·4 claims
- 1561US6377297B1Detection of repeated and frozen frames in a video signalTEKTRONIX INC·Filed 1999·Granted Apr 23, 2002·27 cites·9 claims
- 1660US6075561ALow duty-cycle transport of video reference imagesTEKTRONIX INC·Filed 1998·Granted Jun 13, 2000·23 cites·2 claims
- 1759US6433819B1Detection of Gaussian noise in video signalsTEKTRONIX INC·Filed 1999·Granted Aug 13, 2002·22 cites·4 claims
- 1857US5166609AAdapter and test fixture for an integrated circuit device packageTEKTRONIX INC·Filed 1990·Granted Nov 24, 1992·20 cites·5 claims
- 1956US4277722ACathode ray tube having low voltage focus and dynamic correctionTEKTRONIX INC·Filed 1979·Granted Jul 7, 1981·8 cites·17 claims
- 2054US7773112B2Automatic measurement of video parametersTEKTRONIX INC·Filed 2002·Granted Aug 10, 2010·3 cites·18 claims
- 2154US5202622AAdapter and test fixture for an integrated circuit device packageTEKTRONIX INC·Filed 1991·Granted Apr 13, 1993·18 cites·5 claims
- 2253US5321365AReduced noise sensitivity in inverse scattering through filteringTEKTRONIX INC·Filed 1993·Granted Jun 14, 1994·18 cites·11 claims
- 2352US6437821B1Harmonic measurement of blockiness in video signalsTEKTRONIX INC·Filed 1999·Granted Aug 20, 2002·20 cites·7 claims
- 2450US4623819AAccelerating and scan expansion electron lens means for a cathode ray tubeTEKTRONIX INC·Filed 1985·Granted Nov 18, 1986·9 cites·18 claims
- 2546US4963821AProbe and method for testing a populated circuit boardTEKTRONIX INC·Filed 1989·Granted Oct 16, 1990·14 cites·8 claims
- 2644US6671409B1Blockiness period detection of DCT-based codecsTEKTRONIX INC·Filed 2000·Granted Dec 30, 2003·0 cites·6 claims
- 2741US2004207643A1Attention model enhanced video waveform monitorFiled 2003·Application pending·0 cites
- 2840US2004150672A1Picture analyzer with a window interfaceFiled 2003·Application pending·0 cites
- 2940US2004151469A1Video editing timeline with measurement resultsFiled 2003·Application pending·0 cites
- 3033US4950981AApparatus for testing a circuit boardTEKTRONIX INC·Filed 1989·Granted Aug 21, 1990·3 cites·22 claims
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