Inventor · disambiguated record
Emery Sugasawara
Also filed as: SUGASAWARA EMERY · SUGASAWARA EMERY O · SUGASAWARA EMERY OSAMU
26 granted patents·829 citations·filing 1997–2005
97Inventor score
Top patents by PatentIndex Score
26 records- 0195US6061814ATest circuitry for determining the defect density of a semiconductor process as a function of individual metal layersLSI LOGIC CORP·Filed 1998·Granted May 9, 2000·135 cites·22 claims
- 0292US5972541AReticle and method of design to correct pattern for depth of focus problemsLSI LOGIC CORP·Filed 1998·Granted Oct 26, 1999·96 cites·15 claims
- 0386US6124143AProcess monitor circuitry for integrated circuitsLSI LOGIC CORP·Filed 1998·Granted Sep 26, 2000·81 cites·15 claims
- 0483US6189131B1Method of selecting and synthesizing metal interconnect wires in integrated circuitsLSI LOGIC CORP·Filed 1998·Granted Feb 13, 2001·103 cites·20 claims
- 0583US6185706B1Performance monitoring circuitry for integrated circuitsLSI LOGIC CORP·Filed 1998·Granted Feb 6, 2001·53 cites·21 claims
- 0683US6043672ASelectable power supply lines for isolating defects in integrated circuitsLSI LOGIC CORP·Filed 1998·Granted Mar 28, 2000·53 cites·22 claims
- 0782US6598194B1Test limits based on positionLSI LOGIC CORP·Filed 2000·Granted Jul 22, 2003·31 cites·20 claims
- 0873US6043539AElectro-static discharge protection of CMOS integrated circuitsLSI LOGIC CORP·Filed 1997·Granted Mar 28, 2000·43 cites·15 claims
- 0968US5936876ASemiconductor integrated circuit core probing for failure analysisLSI LOGIC CORP·Filed 1997·Granted Aug 10, 1999·28 cites·17 claims
- 1063US6221681B1On-chip misalignment indicationLSI LOGIC CORP·Filed 1998·Granted Apr 24, 2001·23 cites·9 claims
- 1161US6097884AProbe points and markers for critical paths and integrated circuitsLSI LOGIC CORP·Filed 1997·Granted Aug 1, 2000·22 cites·24 claims
- 1257US6064220ASemiconductor integrated circuit failure analysis using magnetic imagingLSI LOGIC CORP·Filed 1997·Granted May 16, 2000·20 cites·20 claims
- 1355US7354790B2Method and apparatus for avoiding dicing chip-outs in integrated circuit dieLSI LOGIC CORP·Filed 2005·Granted Apr 8, 2008·2 cites·18 claims
- 1454US6782500B1Statistical decision systemLSI LOGIC CORP·Filed 2000·Granted Aug 24, 2004·7 cites·20 claims
- 1552US5998853AMethods and apparatus for electrical marking of integrated circuits to record manufacturing test resultsLSI LOGIC CORP·Filed 1997·Granted Dec 7, 1999·17 cites·17 claims
- 1651US5898228AOn-chip misalignment indicationLSI LOGIC CORP·Filed 1997·Granted Apr 27, 1999·13 cites·13 claims
- 1750US6278129B1Corrosion sensitivity structures for vias and contact holes in integrated circuitsLSI LOGIC CORP·Filed 1999·Granted Aug 21, 2001·15 cites·28 claims
- 1849US6239609B1Reduced voltage quiescent current test methodology for integrated circuitsLSI LOGIC CORP·Filed 1998·Granted May 29, 2001·16 cites·19 claims
- 1942US6037796ACurrent waveform analysis for testing semiconductor devicesLSI LOGIC CORP·Filed 1997·Granted Mar 14, 2000·9 cites·22 claims
- 2042US5953518AYield improvement techniques through layout optimizationLSI LOGIC CORP·Filed 1997·Granted Sep 14, 1999·19 cites·31 claims
- 2140US6103615ACorrosion sensitivity structures for vias and contact holes in integrated circuitsLSI LOGIC CORP·Filed 1998·Granted Aug 15, 2000·9 cites·9 claims
- 2239US6101458AAutomatic ranging apparatus and method for precise integrated circuit current measurementsLSI LOGIC·Filed 1997·Granted Aug 8, 2000·8 cites·16 claims
- 2339US6013533AReal time quiescent current test limit methodologyLSI LOGIC CORP·Filed 1997·Granted Jan 11, 2000·12 cites·13 claims
- 2437US6083848ARemoving solder from integrated circuits for failure analysisLSI LOGIC CORP·Filed 1998·Granted Jul 4, 2000·7 cites·13 claims
- 2534US6102962AMethod for estimating quiescent current in integrated circuitsLSI LOGIC CORP·Filed 1997·Granted Aug 15, 2000·6 cites·20 claims
- 2630US6687661B1Utilizing a technology-independent system description incorporating a metal layer dependent attributeLSI LOGIC CORP·Filed 1998·Granted Feb 3, 2004·1 cites·30 claims
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