Inventor · disambiguated record
Yoshimi Kawanami
Also filed as: KAWANAMI YOSHIMI
79 granted patents·10 pending applications·1,542 citations·filing 1985–2020
99Inventor score
Files withHITACHI LTD34FUJITSU HITACHI PLASMA DISPLAY24HITACHI HIGH TECH CORP12KAWANAMI YOSHIMI6HITACHI HIGH TECH SCIENCE CORP5
Top patents by PatentIndex Score
89 records- 0198US7138628B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2006·Granted Nov 21, 2006·35 cites·24 claims
- 0298US6538254B1Method and apparatus for sample fabricationHITACHI LTD·Filed 1998·Granted Mar 25, 2003·315 cites·19 claims
- 0397US7071475B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2004·Granted Jul 4, 2006·61 cites·8 claims
- 0497US6828566B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2003·Granted Dec 7, 2004·62 cites·24 claims
- 0596US7176458B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2006·Granted Feb 13, 2007·18 cites·13 claims
- 0696US5825035AProcessing method and apparatus using focused ion beam generating meansHITACHI LTD·Filed 1996·Granted Oct 20, 1998·140 cites·16 claims
- 0795US7525108B2Focused ion beam apparatus for specimen fabricationHITACHI LTD·Filed 2007·Granted Apr 28, 2009·16 cites·30 claims
- 0895US7397050B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2007·Granted Jul 8, 2008·16 cites·25 claims
- 0995US7397052B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2007·Granted Jul 8, 2008·16 cites·11 claims
- 1095US7119479B2Display panel deviceFUJITSU HITACHI PLASMA DISPLAY·Filed 2005·Granted Oct 10, 2006·20 cites·4 claims
- 1195US6608441B2Plasma display panel and method for manufacturing the sameFUJITSU HITACHI PLASMA DISPLAY·Filed 2001·Granted Aug 19, 2003·53 cites·14 claims
- 1295US5504340AProcess method and apparatus using focused ion beam generating meansHITACHI LTD·Filed 1994·Granted Apr 2, 1996·94 cites·37 claims
- 1394US4936968AIon-beam machining method and apparatusHITACHI LTD·Filed 1989·Granted Jun 26, 1990·61 cites·17 claims
- 1493US7116059B2Display device and display panel deviceFUJITSU HITACHI PLASMA DISPLAY·Filed 2005·Granted Oct 3, 2006·12 cites·13 claims
- 1593US5583344AProcess method and apparatus using focused ion beam generating meansHITACHI LTD·Filed 1996·Granted Dec 10, 1996·73 cites·6 claims
- 1692US7397051B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2007·Granted Jul 8, 2008·8 cites·9 claims
- 1791US8569719B2Method and apparatus for specimen fabricationTOMIMATSU SATOSHI·Filed 2011·Granted Oct 29, 2013·6 cites·18 claims
- 1889US4755685AIon micro beam apparatusHITACHI LTD·Filed 1986·Granted Jul 5, 1988·41 cites·7 claims
- 1988US6583426B1Projection ion beam machining apparatusHITACHI LTD·Filed 1997·Granted Jun 24, 2003·56 cites·12 claims
- 2087US7561152B2Display device and display panel deviceFUJITSU HITACHI PLASMA DISPLAY·Filed 2006·Granted Jul 14, 2009·6 cites·14 claims
- 2187US7492081B2Display panel module and method for manufacturing the sameFUJITSU HITACHI PLASMA DISPLAY·Filed 2005·Granted Feb 17, 2009·10 cites·12 claims
- 2286US8405053B2Method and apparatus for specimen fabricationTOMIMATSU SATOSHI·Filed 2011·Granted Mar 26, 2013·4 cites·3 claims
- 2386US7999240B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2008·Granted Aug 16, 2011·4 cites·14 claims
- 2486US7332865B2Display panel device with a light-permeable front sheetFUJITSU HITACHI PLASMA DISPLAY·Filed 2006·Granted Feb 19, 2008·6 cites·24 claims
- 2584US7791050B2Method and apparatus for specimen fabricationHITACHI LTD·Filed 2008·Granted Sep 7, 2010·4 cites·36 claims
- 2684US6333599B1Plasma display systemHITACHI LTD·Filed 1999·Granted Dec 25, 2001·42 cites·20 claims
- 2783US7898510B2Display device and display panel deviceFUJITSU HITACHI PLASMA DISPLAY·Filed 2008·Granted Mar 1, 2011·6 cites·11 claims
- 2883US4710632AIon microbeam apparatusHITACHI LTD·Filed 1985·Granted Dec 1, 1987·28 cites·8 claims
- 2982US6855026B2Method for forming partitions of plasma display panel by using sandblasting processFUJITSU LTD·Filed 2003·Granted Feb 15, 2005·13 cites·14 claims
- 3081US10163602B2Ion beam systemHITACHI HIGH TECH SCIENCE CORP·Filed 2017·Granted Dec 25, 2018·2 cites·15 claims
- 3181USRE42405EMethod for forming partitions of plasma display panel by using sandblasting processFUJITSU HITACHI PLASMA DISPLAY·Filed 2008·Granted May 31, 2011·4 cites·47 claims
- 3279US8847173B2Gas field ion source and method for using same, ion beam device, and emitter tip and method for manufacturing sameKAWANAMI YOSHIMI·Filed 2011·Granted Sep 30, 2014·5 cites·9 claims
- 3379US7755287B2Display panel device with a light-permeable front sheetFUJITSU HITACHI PLASMA DISPLAY·Filed 2007·Granted Jul 13, 2010·3 cites·13 claims
- 3479US6274876B1Inspection apparatus and method using particle beam and the particle-beam-applied apparatusHITACHI LTD·Filed 2000·Granted Aug 14, 2001·14 cites·11 claims
- 3579US5065034ACharged particle beam apparatusHITACHI LTD·Filed 1990·Granted Nov 12, 1991·39 cites·31 claims
- 3678US4939364ASpecimen or substrate cutting method using focused charged particle beam and secondary ion spectroscopic analysis method utilizing the cutting methodHITACHI LTD·Filed 1988·Granted Jul 3, 1990·21 cites·15 claims
- 3777US6844684B2Front film for flat display panel and flat display device using the sameFUJITSU HITACHI PLASMA DISPLAY·Filed 2003·Granted Jan 18, 2005·12 cites·19 claims
- 3873US7233107B2Mesh-pattern partitioned plasma display panelFUJITSU HITACHI PLASMA DISPLAY·Filed 2004·Granted Jun 19, 2007·9 cites·9 claims
- 3972US10790112B2Focused ion beam apparatusHITACHI HIGH TECH SCIENCE CORP·Filed 2018·Granted Sep 29, 2020·1 cites·6 claims
- 4072US7450090B2Plasma display panel and imaging device using the sameHITACHI LTD·Filed 2006·Granted Nov 11, 2008·1 cites·78 claims
- 4171US9640360B2Ion source and ion beam device using sameHITACHI HIGH TECH CORP·Filed 2012·Granted May 2, 2017·2 cites·11 claims
- 4271US9058959B2Scanning ion microscope and secondary particle control methodHITACHI HIGH TECH CORP·Filed 2012·Granted Jun 16, 2015·2 cites·12 claims
- 4371US8981315B2Ion beam device having gas introduction port disposed on structure maintained at ground potentialMUTO HIROYUKI·Filed 2012·Granted Mar 17, 2015·2 cites·14 claims
- 4469US10658143B2Method of manufacturing emitterHITACHI HIGH TECH SCIENCE CORP·Filed 2019·Granted May 19, 2020·1 cites·11 claims
- 4569US7531952B2Display panel deviceFUJITSU HITACHI PLASMA DISPLAY·Filed 2005·Granted May 12, 2009·2 cites·12 claims
- 4669US6140644AInspection apparatus and method using a particle beamHITACHI LTD·Filed 1998·Granted Oct 31, 2000·28 cites·12 claims
- 4768US9087675B2Emitter, gas field ion source, and ion beam deviceKAWANAMI YOSHIMI·Filed 2012·Granted Jul 21, 2015·2 cites·17 claims
- 4868US5767516AElectron microscope and sample observing method using the sameHITACHI LTD·Filed 1996·Granted Jun 16, 1998·20 cites·9 claims
- 4968US5077266AMethod of forming weak-link josephson junction, and superconducting device employing the junctionHITACHI LTD·Filed 1989·Granted Dec 31, 1991·25 cites·16 claims
- 5067USRE40502EPlasma display panel and method for manufacturing the sameFUJITSU HITACHI PLASMA DISPLAY·Filed 2005·Granted Sep 16, 2008·1 cites·37 claims
Showing the top 50 of 89 patent records by PatentIndex Score.
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