Inventor · disambiguated record
Michinobu Nakao
Also filed as: NAKAO MICHINOBU
6 granted patents·3 pending applications·106 citations·filing 1998–2011
82Inventor score
Files withHITACHI LTD4HITACHI INFORMATION TECHNOLOGY1MATSUMOTO CHIZU1RENESAS ELECTRONICS CORP1RENESAS TECH CORP1
Top patents by PatentIndex Score
9 records- 0176US6922803B2Test method of semiconductor intergrated circuit and test pattern generatorHITACHI INFORMATION TECHNOLOGY·Filed 2001·Granted Jul 26, 2005·23 cites·12 claims
- 0273US6484294B1Semiconductor integrated circuit and method of designing the sameHITACHI LTD·Filed 1999·Granted Nov 19, 2002·35 cites·7 claims
- 0372US7036060B2Semiconductor integrated circuit and its analyzing methodHITACHI LTD·Filed 2003·Granted Apr 25, 2006·17 cites·3 claims
- 0469US6038691AMethod of analyzing logic circuit test points, apparatus for analyzing logic circuit test points and semiconductor integrated circuit with test pointsHITACHI LTD·Filed 1998·Granted Mar 14, 2000·31 cites·21 claims
- 0537US2009158087A1Semiconductor integrated circuit with memory repair circuitRENESAS TECH CORP·Filed 2008·Application pending·0 cites
- 0636US2011161751A1Semiconductor integrated circuit with memory repair circuitRENESAS ELECTRONICS CORP·Filed 2011·Application pending·0 cites
- 0733US2003070118A1Semiconductor integrated circuit with built-in test functionHITACHI LTD·Filed 2002·Application pending·0 cites
- 0831US7983858B2Fault test apparatus and method for testing semiconductor device under test using fault excitation functionSEMICONDUCTOR TECH ACAD RES CT·Filed 2008·Granted Jul 19, 2011·0 cites·14 claims
- 0925US8400853B2Semiconductor chip and method of repair design of the sameMATSUMOTO CHIZU·Filed 2010·Granted Mar 19, 2013·0 cites·3 claims
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