Inventor · disambiguated record
Thomas Bartenstein
Also filed as: BARTENSTEIN THOMAS · BARTENSTEIN THOMAS W · BARTENSTEIN THOMAS WEBSTER
10 granted patents·1 pending application·111 citations·filing 2000–2010
89Inventor score
Files withIBM4CADENCE DESIGN SYSTEMS INC2BARTENSTEIN THOMAS W1BARTENSTEIN THOMAS WEBSTER1CADENCE DESIGN SYSTEM INC1
Top patents by PatentIndex Score
11 records- 0182US6901542B2Internal cache for on chip test data storageIBM·Filed 2001·Granted May 31, 2005·35 cites·33 claims
- 0281US7496816B2Isolating the location of defects in scan chainsCADENCE DESIGN SYSTEM INC·Filed 2006·Granted Feb 24, 2009·13 cites·26 claims
- 0372US6721914B2Diagnosis of combinational logic circuit failuresIBM·Filed 2001·Granted Apr 13, 2004·18 cites·12 claims
- 0472US6708306B2Method for diagnosing failures using invariant analysisCADENCE DESIGN SYSTEMS INC·Filed 2000·Granted Mar 16, 2004·18 cites·13 claims
- 0569US8402421B2Method and system for subnet defect diagnostics through fault compositingBARTENSTEIN THOMAS WEBSTER·Filed 2010·Granted Mar 19, 2013·4 cites·21 claims
- 0667US8190953B2Method and system for selecting test vectors in statistical volume diagnosis using failed test dataCHAKRAVARTHY SAMEER H·Filed 2008·Granted May 29, 2012·8 cites·30 claims
- 0765US8397113B2Method and system for identifying power defects using test pattern switching activityBARTENSTEIN THOMAS W·Filed 2010·Granted Mar 12, 2013·3 cites·11 claims
- 0860US7821276B2Method and article of manufacture to generate IC test vector for synchronized physical probingCADENCE DESIGN SYSTEMS INC·Filed 2008·Granted Oct 26, 2010·3 cites·9 claims
- 0958US6675323B2Incremental fault dictionaryIBM·Filed 2001·Granted Jan 6, 2004·8 cites·7 claims
- 1055US8120378B2System to control insertion of care-bits in an IC test vector improved optical probingSWENTON JOSEPH·Filed 2010·Granted Feb 21, 2012·1 cites·6 claims
- 1128US2002188904A1Efficiency of fault simulation by logic backtrackingIBM·Filed 2001·Application pending·0 cites
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