Inventor · disambiguated record
Michal Haim Yachini
Also filed as: YACHINI MICHAL · YACHINI MICHAL HAIM
3 granted patents·2 pending applications·3 citations·filing 2015–2024
57Inventor score
Top patents by PatentIndex Score
5 records- 0186US10876959B2Method and system for optical characterization of patterned samplesNOVA MEASURING INSTR LTD·Filed 2018·Granted Dec 29, 2020·2 cites·3 claims
- 0284US11885737B2Method and system for optical characterization of patterned samplesNOVA LTD·Filed 2020·Granted Jan 30, 2024·1 cites·8 claims
- 0384US2024337590A1Method and system for optical characterization of patterned samplesNOVA LTD·Filed 2024·Application pending·0 cites
- 0447US2024068964A1Evaluating x-ray signals from a perturbed objectNOVA LTD·Filed 2021·Application pending·0 cites
- 0532US10311198B2Overlay design optimizationNOVA MEASURING INSTR LTD·Filed 2015·Granted Jun 4, 2019·0 cites·13 claims
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