Inventor · disambiguated record
Hidemitsu Hakii
Also filed as: HAKII HIDEMITSU
4 granted patents·4 pending applications·9 citations·filing 2009–2025
64Inventor score
Top patents by PatentIndex Score
8 records- 0180US8604431B2Pattern-height measuring apparatus and pattern-height measuring methodMURAKAWA TSUTOMU·Filed 2012·Granted Dec 10, 2013·6 cites·12 claims
- 0276US11097568B2Optical device, display body, device provided with a display body, optical filter, and method for manufacturing an optical deviceTOPPAN PRINTING CO LTD·Filed 2018·Granted Aug 24, 2021·3 cites·13 claims
- 0368US2025339854A1Microchannel chip and method for producing the sameTOPPAN HOLDINGS INC·Filed 2025·Application pending·0 cites
- 0464US2024165609A1Microfluidic chip and method of producing microfluidic chipTOPPAN INC·Filed 2024·Application pending·0 cites
- 0563US2025033039A1Microfluidic chip and method for manufacturing microfluidic chipTOPPAN HOLDINGS INC·Filed 2024·Application pending·0 cites
- 0646US11867933B2Display having sub-wavelength polygonal periodic elementsTOPPAN PRINTING CO LTD·Filed 2020·Granted Jan 9, 2024·0 cites·8 claims
- 0740US8754935B2Microstructure inspection method, microstructure inspection apparatus, and microstructure inspection programYONEKURA ISAO·Filed 2009·Granted Jun 17, 2014·0 cites·10 claims
- 0839US2012318976A1Pattern measurement apparatus and pattern measurement methodMATSUMOTO JUN·Filed 2012·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →