Inventor · disambiguated record
Eric Paul Tabor
Also filed as: TABOR ERIC PAUL
9 granted patents·1 pending application·276 citations·filing 2001–2009
91Inventor score
Top patents by PatentIndex Score
10 records- 0190US6792373B2Methods and apparatus for semiconductor testingTEST ADVANTAGE INC·Filed 2002·Granted Sep 14, 2004·59 cites·20 claims
- 0287US7395170B2Methods and apparatus for data analysisTEST ADVANTAGE INC·Filed 2004·Granted Jul 1, 2008·49 cites·45 claims
- 0386US8417477B2Methods and apparatus for local outlier detectionMIGUELANEZ EMILIO·Filed 2005·Granted Apr 9, 2013·15 cites·40 claims
- 0486US7437271B2Methods and apparatus for data analysisTEST ADVANTAGE INC·Filed 2005·Granted Oct 14, 2008·10 cites·51 claims
- 0585US7225107B2Methods and apparatus for data analysisTEST ADVANTAGE INC·Filed 2003·Granted May 29, 2007·64 cites·38 claims
- 0683US8000928B2Methods and apparatus for data analysisTEST ADVANTAGE INC·Filed 2008·Granted Aug 16, 2011·12 cites·45 claims
- 0781US7167811B2Methods and apparatus for data analysisTEST ADVANTAGE INC·Filed 2003·Granted Jan 23, 2007·24 cites·47 claims
- 0881US6782297B2Methods and apparatus for data smoothingFiled 2001·Granted Aug 24, 2004·34 cites·40 claims
- 0974US8041541B2Methods and apparatus for data analysisTEST ADVANTAGE INC·Filed 2007·Granted Oct 18, 2011·9 cites·38 claims
- 1052US2010088054A1Methods and apparatus for data analysisMIGUELANEZ EMILIO·Filed 2009·Application pending·0 cites
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