Inventor · disambiguated record
Amit Batikoff
Also filed as: BATIKOFF AMIT
19 granted patents·1 pending application·54 citations·filing 2011–2021
91Inventor score
Top patents by PatentIndex Score
20 records- 0191US11205119B2Method of deep learning-based examination of a semiconductor specimen and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted Dec 21, 2021·11 cites·20 claims
- 0287US8977035B2System, method and computer program product for detection of defects within inspection imagesDALLA-TORRE MICHELE·Filed 2012·Granted Mar 10, 2015·19 cites·19 claims
- 0386US12183066B2Method of deep learning-based examination of a semiconductor specimen and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2021·Granted Dec 31, 2024·1 cites·17 claims
- 0485US9851714B2Method of inspecting a specimen and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Granted Dec 26, 2017·6 cites·16 claims
- 0584US9098893B2System, method and computer program product for classification within inspection imagesDALLA-TORRE MICHELE·Filed 2011·Granted Aug 4, 2015·8 cites·14 claims
- 0680US11348001B2Method of deep learning-based examination of a semiconductor specimen and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted May 31, 2022·3 cites·20 claims
- 0780US11010665B2Method of deep learning-based examination of a semiconductor specimen and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted May 18, 2021·3 cites·18 claims
- 0877US10545490B2Method of inspecting a specimen and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Granted Jan 28, 2020·3 cites·18 claims
- 0960US10928437B2Method of inspecting a specimen and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Feb 23, 2021·0 cites·20 claims
- 1059US12269500B2Alignment validation in vehicle-based sensorsGM GLOBAL TECH OPERATIONS LLC·Filed 2021·Granted Apr 8, 2025·0 cites·20 claims
- 1157US10571406B2Method of performing metrology operations and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Feb 25, 2020·0 cites·20 claims
- 1257US10444274B2Method of inspecting a specimen and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Oct 15, 2019·0 cites·15 claims
- 1356US10120973B2Method of performing metrology operations and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted Nov 6, 2018·0 cites·17 claims
- 1451US11292487B2Methods and systems for controlling automated driving features of a vehicleGM GLOBAL TECH OPERATIONS LLC·Filed 2019·Granted Apr 5, 2022·0 cites·12 claims
- 1550US10012689B2Method of inspecting a specimen and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Granted Jul 3, 2018·0 cites·14 claims
- 1645US11568565B2Rendering-based lidar and camera alignmentGM GLOBAL TECH OPERATIONS LLC·Filed 2021·Granted Jan 31, 2023·0 cites·16 claims
- 1743US10902620B1Registration between an image of an object and a descriptionAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Jan 26, 2021·0 cites·19 claims
- 1842US2015310600A1System, method and computer program product for classification within inspection imagesAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Application pending·0 cites
- 1941US10296702B2Method of performing metrology operations and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted May 21, 2019·0 cites·20 claims
- 2039US10430938B2Method of detecting defects in an objectAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted Oct 1, 2019·0 cites·22 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →