Inventor
BAINS KULJIT S
US179 patents
⚠️ This page may combine multiple inventors who share the name “BAINS KULJIT S”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INTEL CORP
42 patentsUS9384821B2Jul 5, 2016
Row hammer monitoring based on stored row hammer threshold value
INTEL CORP106 citations99
US9032141B2May 12, 2015
Row hammer monitoring based on stored row hammer threshold value
INTEL CORP151 citations99
US10210925B2Feb 19, 2019
Row hammer refresh command
INTEL CORP75 citations98
US10083737B2Sep 25, 2018
Row hammer monitoring based on stored row hammer threshold value
INTEL CORP79 citations98
US9934143B2Apr 3, 2018
Mapping a physical address differently to different memory devices in a group
INTEL CORP77 citations98
US9865326B2Jan 9, 2018
Row hammer refresh command
INTEL CORP83 citations98
US9747971B2Aug 29, 2017
Row hammer refresh command
INTEL CORP84 citations98
US9299400B2Mar 29, 2016
Distributed row hammer tracking
INTEL CORP72 citations98
US9286964B2Mar 15, 2016
Method, apparatus and system for responding to a row hammer event
INTEL CORP88 citations98
US7281079B2Oct 9, 2007
Method and apparatus to counter mismatched burst lengths
INTEL CORP78 citations98
US5701438ADec 23, 1997
Logical relocation of memory based on memory device type
INTEL CORP132 citations98
US7432731B2Oct 7, 2008
Method and apparatus to calibrate DRAM on resistance (Ron) and on-die termination (ODT) values over process, voltage and temperature (PVT) variations
INTEL CORP67 citations97
US7386765B2Jun 10, 2008
Memory device having error checking and correction
INTEL CORP72 citations97
US6996749B1Feb 7, 2006
Method and apparatus for providing debug functionality in a buffered memory channel
INTEL CORP48 citations95
US10872011B2Dec 22, 2020
Internal error checking and correction (ECC) with extra system bits
INTEL CORP27 citations94
US10810079B2Oct 20, 2020
Memory device error check and scrub mode and error transparency
INTEL CORP26 citations94
US10127101B2Nov 13, 2018
Memory device error check and scrub mode and error transparency
INTEL CORP29 citations94
US9780782B2Oct 3, 2017
On-die termination control without a dedicated pin in a multi-rank system
INTEL CORP34 citations94
US10141935B2Nov 27, 2018
Programmable on-die termination timing in a multi-rank system
INTEL CORP22 citations93
US9842021B2Dec 12, 2017
Memory device check bit read mode
INTEL CORP13 citations93
US9817714B2Nov 14, 2017
Memory device on-die error checking and correcting code
INTEL CORP24 citations93
US9761298B2Sep 12, 2017
Method, apparatus and system for responding to a row hammer event
INTEL CORP15 citations93
US9721643B2Aug 1, 2017
Row hammer monitoring based on stored row hammer threshold value
INTEL CORP20 citations93
US7774684B2Aug 10, 2010
Reliability, availability, and serviceability in a memory device
INTEL CORP30 citations93
US6269443B1Jul 31, 2001
Method and apparatus for automatically selecting CPU clock frequency multiplier
INTEL CORP20 citations93
US7872892B2Jan 18, 2011
Identifying and accessing individual memory devices in a memory channel
INTEL CORP21 citations92
US7412627B2Aug 12, 2008
Method and apparatus for providing debug functionality in a buffered memory channel
INTEL CORP16 citations92
US7353329B2Apr 1, 2008
Memory buffer device integrating refresh logic
INTEL CORP21 citations92
US5740385AApr 14, 1998
Low load host/PCI bus bridge
INTEL CORP22 citations92
US6112284AAug 29, 2000
Method and apparatus for latching data from a memory resource at a datapath unit
INTEL CORP36 citations89
US5678009AOct 14, 1997
Method and apparatus providing fast access to a shared resource on a computer bus
INTEL CORP46 citations89
US11314589B2Apr 26, 2022
Read retry to selectively disable on-die ECC
INTEL CORP8 citations86
US10496473B2Dec 3, 2019
Extracting selective information from on-die dynamic random access memory (DRAM) error correction code (ECC)
INTEL CORP11 citations84
US10490239B2Nov 26, 2019
Programmable data pattern for repeated writes to memory
INTEL CORP9 citations84
US10224090B2Mar 5, 2019
Directed per bank refresh command
INTEL CORP4 citations84
US10146711B2Dec 4, 2018
Techniques to access or operate a dual in-line memory module via multiple data channels
INTEL CORP14 citations84
US10108512B2Oct 23, 2018
Validation of memory on-die error correction code
INTEL CORP12 citations84
US9870325B2Jan 16, 2018
Common die implementation for memory devices with independent interface paths
INTEL CORP13 citations84
US9811420B2Nov 7, 2017
Extracting selective information from on-die dynamic random access memory (DRAM) error correction code (ECC)
INTEL CORP7 citations84
US9804793B2Oct 31, 2017
Techniques for a write zero operation
INTEL CORP7 citations84
US9721641B2Aug 1, 2017
Apparatus, method and system for memory device access with a multi-cycle command
INTEL CORP9 citations84
US9691468B2Jun 27, 2017
Directed per bank refresh command
INTEL CORP4 citations84
BAINS KULJIT S
4 patentsUS9236110B2Jan 12, 2016
Row hammer refresh command
BAINS KULJIT S65 citations98
US8862973B2Oct 14, 2014
Method and system for error management in a memory device
BAINS KULJIT S91 citations98
US8392650B2Mar 5, 2013
Fast exit from self-refresh state of a memory device
BAINS KULJIT S15 citations93
US8161356B2Apr 17, 2012
Systems, methods, and apparatuses to save memory self-refresh power
BAINS KULJIT S26 citations92
MCCALL JAMES A
2 patentsGREENFIELD ZVIKA
1 patentMACWILLIAMS PETER
1 patentShowing the top 50 of 179 patents by PatentIndex Score.