Inventor · disambiguated record
Yuko Nambu
Also filed as: NAMBU YUKO
4 granted patents·1 pending application·43 citations·filing 1999–2003
76Inventor score
Files withMATSUSHITA ELECTRIC INDUSTRIAL CO LTD5
Top patents by PatentIndex Score
5 records- 0167US6666577B2Method for predicting temperature, test wafer for use in temperature prediction, and method for evaluating lamp heating systemMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Dec 23, 2003·12 cites·6 claims
- 0255US6799888B2Method for predicting temperature, test wafer for use in temperature prediction, and method for evaluating lamp heating systemMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Granted Oct 5, 2004·6 cites·6 claims
- 0355US6475815B1Method of measuring temperature, method of taking samples for temperature measurement and method for fabricating semiconductor deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1999·Granted Nov 5, 2002·21 cites·37 claims
- 0449US6616331B2Method for predicting temperature and test wafer for use in temperature predictionMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Sep 9, 2003·4 cites·13 claims
- 0542US2004047394A1Method for predicting temperature, test wafer for use in temperature prediction, and method for evaluating lamp heating systemMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Application pending·0 cites
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