Inventor · disambiguated record
Wilfried Vandervorst
Also filed as: VANDERVORST WILFRIED · VANDERVORST WILFRIED B M
28 granted patents·4 pending applications·503 citations·filing 1991–2021
96Inventor score
Top patents by PatentIndex Score
32 records- 0196US7598482B1Wavelength-sensitive detector with elongate nanostructuresIMEC·Filed 2006·Granted Oct 6, 2009·85 cites·54 claims
- 0291US6504152B2Probe tip configuration and a method of fabrication thereofIMEC VZW·Filed 2001·Granted Jan 7, 2003·42 cites·16 claims
- 0390US6690008B2Probe and method of manufacturing mounted AFM probesIMEC INTER UNI MICRO ELECTR·Filed 2001·Granted Feb 10, 2004·46 cites·24 claims
- 0482US5723981AMethod for measuring the electrical potential in a semiconductor elementIMEC VZW·Filed 1996·Granted Mar 3, 1998·73 cites·21 claims
- 0580US9612258B2Probe configuration and method of fabrication thereofIMEC·Filed 2014·Granted Apr 4, 2017·5 cites·8 claims
- 0680US6809317B2Method and apparatus for local surface analysisIMEC INTER UNI MICRO ELECTR·Filed 2002·Granted Oct 26, 2004·15 cites·22 claims
- 0780US6328902B1Probe tip configuration and a method of fabrication thereofIMEC VZW·Filed 1998·Granted Dec 11, 2001·54 cites·21 claims
- 0875US6201401B1Method for measuring the electrical potential in a semiconductor elementIMEC·Filed 1998·Granted Mar 13, 2001·50 cites·33 claims
- 0972US10746759B2Method for determining the shape of a sample tip for atom probe tomographyIMEC VZW·Filed 2019·Granted Aug 18, 2020·2 cites·20 claims
- 1071US6091248AMethod for measuring the electrical potential in a semiconductor elementIMEC VZW·Filed 1998·Granted Jul 18, 2000·43 cites·31 claims
- 1171US5585734AMethod for determining the resistance and carrier profile of a semiconductor element using a scanning proximity microscopeIMEC INTER UNI MICRO ELECTR·Filed 1994·Granted Dec 17, 1996·31 cites·31 claims
- 1264US7133128B2System and method for measuring properties of a semiconductor substrate in a non-destructive wayIMEC INTER UNI MICRO ELECTR·Filed 2003·Granted Nov 7, 2006·6 cites·27 claims
- 1360US9588137B2Method for determining local resistivity and carrier concentration using scanning spreading resistance measurement set-upIMEC·Filed 2013·Granted Mar 7, 2017·1 cites·8 claims
- 1459US8484761B2Method for cost-efficient manufacturing diamond tips for ultra-high resolution electrical measurements and devices obtained thereofHANTSCHEL THOMAS·Filed 2009·Granted Jul 9, 2013·3 cites·23 claims
- 1559US6756584B2Probe tip and method of manufacturing probe tips by peel-offIMEC INTER UNI MICRO ELECTR·Filed 2001·Granted Jun 29, 2004·14 cites·18 claims
- 1652US5995912ADatabase and method for measurement correction for cross-sectional carrier profiling techniquesIMEC VZW·Filed 1997·Granted Nov 30, 1999·22 cites·16 claims
- 1750US12500062B2Reconstruction method for atom probe tomographyUNIV ANTWERPEN·Filed 2021·Granted Dec 16, 2025·0 cites·15 claims
- 1850US10541108B2Method and apparatus for transmission electron microscopyIMEC VZW·Filed 2018·Granted Jan 21, 2020·0 cites·16 claims
- 1948US8232517B2Wavelength-sensitive detector comprising photoconductor units each having different types of elongated nanostructuresVERHULST ANNE S·Filed 2009·Granted Jul 31, 2012·2 cites·2 claims
- 2047US8717570B2Method for determining the active doping concentration of a doped semiconductor regionIMEC·Filed 2012·Granted May 6, 2014·0 cites·10 claims
- 2147US6823723B2Method and apparatus for performing atomic force microscopy measurementsIMEC INTER UNI MICRO ELECTR·Filed 2002·Granted Nov 30, 2004·6 cites·22 claims
- 2245US8872230B2Tunnel field-effect transistor and methods for manufacturing thereofIMEC·Filed 2012·Granted Oct 28, 2014·0 cites·20 claims
- 2344US11125805B2Device for measuring surface characteristics of a materialIMEC VZW·Filed 2019·Granted Sep 21, 2021·0 cites·15 claims
- 2444US2020006034A1Characterization of regions with different crystallinity in materialsIMEC VZW·Filed 2019·Application pending·0 cites
- 2542US8211812B2Method for fabricating a high-K dielectric layerRAGNARSSON LARS-AKE·Filed 2008·Granted Jul 3, 2012·0 cites·15 claims
- 2641US2012080596A1Laser Atom Probe and Laser Atom Probe Analysis MethodsVANDERVORST WILFRIED·Filed 2011·Application pending·0 cites
- 2739US10014178B2Method for differential heating of elongate nano-scaled structuresIMEC VZW·Filed 2016·Granted Jul 3, 2018·0 cites·16 claims
- 2839US2015226766A1Apparatus and method for atomic force microscopyBRUKER NANO INC·Filed 2013·Application pending·0 cites
- 2936US11549963B2Method and apparatus for aligning a probe for scanning probe microscopy to the tip of a pointed sampleIMEC VZW·Filed 2019·Granted Jan 10, 2023·0 cites·18 claims
- 3036US2011097881A1Method of Forming Mono-Crystalline Germanium or Silicon GermaniumIMEC·Filed 2010·Application pending·0 cites
- 3135US10495666B2Device and method for two dimensional active carrier profiling of semiconductor componentsIMEC VZW·Filed 2018·Granted Dec 3, 2019·0 cites·12 claims
- 3232US5369372AMethod for resistance measurements on a semiconductor element with controlled probe pressureIMEC INTER UNI MICRO ELECTR·Filed 1991·Granted Nov 29, 1994·3 cites·10 claims
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