Inventor · disambiguated record
Jen-Yu Fang
Also filed as: FANG JEN-YU
2 granted patents·1 pending application·4 citations·filing 2007–2018
48Inventor score
Top patents by PatentIndex Score
3 records- 0184US9869940B2Metrology method and apparatus, computer program and lithographic systemASML NETHERLANDS BV·Filed 2016·Granted Jan 16, 2018·3 cites·18 claims
- 0274US10261427B2Metrology method and apparatus, computer program and lithographic systemASML NETHERLANDS BV·Filed 2018·Granted Apr 16, 2019·1 cites·8 claims
- 0335US2008239728A1Light control device having modified prism structureCHIANG TIEN-HON·Filed 2007·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →